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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 12 — Apr. 20, 2008
  • pp: 2103–2108

Three-dimensional profiling using the Fourier transform method with a hexagonal grating projection

Koichi Iwata, Fuminori Kusunoki, Kousuke Moriwaki, Hiroki Fukuda, and Takaharu Tomii  »View Author Affiliations

Applied Optics, Vol. 47, Issue 12, pp. 2103-2108 (2008)

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We present three-dimensional profilometry based on triangulation in which a hexagonal pattern is projected on the object. To obtain an accurate result with a one-shot photographic image, the Fourier transform method and method of excess fraction are adopted. The three grating components of the hexagonal pattern are used. For compactness a new pattern projection scheme is introduced. The experimental results show that the constructed optical system works well for measuring the profile of a mannequin with a height resolution of ± 1 mm .

© 2008 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(150.3045) Machine vision : Industrial optical metrology
(100.5088) Image processing : Phase unwrapping

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 28, 2008
Revised Manuscript: March 9, 2008
Manuscript Accepted: March 11, 2008
Published: April 17, 2008

Koichi Iwata, Fuminori Kusunoki, Kousuke Moriwaki, Hiroki Fukuda, and Takaharu Tomii, "Three-dimensional profiling using the Fourier transform method with a hexagonal grating projection," Appl. Opt. 47, 2103-2108 (2008)

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