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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 13 — May. 1, 2008
  • pp: 2458–2464

Observation of nanoparticle internalization on cellular membranes by using noninterferometric widefield optical profilometry

Chun-Chieh Wang, Chia-Wei Lee, Chia-Yun Huang, Jiunn-Yuan Lin, Pei-Kuen Wei, and Chau-Hwang Lee  »View Author Affiliations


Applied Optics, Vol. 47, Issue 13, pp. 2458-2464 (2008)
http://dx.doi.org/10.1364/AO.47.002458


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Abstract

We demonstrate the observation of gold-nanoparticle internalization in membranes of living cells by using noninterferometric widefield optical profilometry (NIWOP). The NIWOP technique can trace the height of an 80 nm gold particle on the membrane by calibrating the change of light intensity scattered from the particle along the optical axis. On the membrane, the depth resolution based on the scattering signal is similar to that based on the reflection signal, nearly 20 nm . Comparing the heights of the nanoparticle and the nearby cell membranes, we can identify the occurrence of particle internalization. Combining fluorescence microscopy with NIWOP, we also find actin aggregation around the site of the internalization process, which is an indication of endocytosis.

© 2008 Optical Society of America

OCIS Codes
(170.1530) Medical optics and biotechnology : Cell analysis
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(180.6900) Microscopy : Three-dimensional microscopy
(290.5850) Scattering : Scattering, particles

ToC Category:
Medical Optics and Biotechnology

History
Original Manuscript: December 18, 2007
Revised Manuscript: April 2, 2008
Manuscript Accepted: April 2, 2008
Published: April 28, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Chun-Chieh Wang, Chia-Wei Lee, Chia-Yun Huang, Jiunn-Yuan Lin, Pei-Kuen Wei, and Chau-Hwang Lee, "Observation of nanoparticle internalization on cellular membranes by using noninterferometric widefield optical profilometry," Appl. Opt. 47, 2458-2464 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-13-2458


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