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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 13 — May. 1, 2008
  • pp: C135–C142

Characterization of low losses in optical thin films and materials

Christian Mühlig, Wolfgang Triebel, Siegfried Kufert, and Simon Bublitz  »View Author Affiliations

Applied Optics, Vol. 47, Issue 13, pp. C135-C142 (2008)

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Residual absorption in optical coatings and materials is directly measured by means of the laser-induced deflection (LID) technique. For transmissive coatings a measurement strategy is introduced that allows for the separation of different absorptions of the investigated sample (bulk, coating, surface) by use of only one sample. Laser irradiation yields absorption values between 2 × 10 3 and 2.9 × 10 2 for antireflecting and highly reflecting (HR) coatings at 193 nm and 30.6 × 10 6 for a HR mirror at 527 nm . Use of laser-induced fluorescence at 193 nm excitation reveals trivalent cerium and prasodymium and hydrocarbons in different single layers and coatings. In addition to correlation with absorption data, the influence of a high fluorescence quantum yield on the absorption measurement is discussed.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(160.4670) Materials : Optical materials
(300.1030) Spectroscopy : Absorption
(300.2530) Spectroscopy : Fluorescence, laser-induced
(310.0310) Thin films : Thin films

Original Manuscript: August 2, 2007
Revised Manuscript: October 15, 2007
Manuscript Accepted: October 19, 2007
Published: December 3, 2007

Christian Mühlig, Wolfgang Triebel, Siegfried Kufert, and Simon Bublitz, "Characterization of low losses in optical thin films and materials," Appl. Opt. 47, C135-C142 (2008)

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