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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 13 — May. 1, 2008
  • pp: C257–C265

From angle-resolved ellipsometry of light scattering to imaging in random media

Gaelle Georges, Laurent Arnaud, Laure Siozade, Nora Le Neindre, Frédéric Chazallet, Myriam Zerrad, Carole Deumié, and Claude Amra  »View Author Affiliations

Applied Optics, Vol. 47, Issue 13, pp. C257-C265 (2008)

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A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight departure from perfect correlation within multilayers. Experiments and a procedure for selective imaging in random media are described.

© 2008 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.7050) Imaging systems : Turbid media
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements

Original Manuscript: July 26, 2007
Revised Manuscript: November 9, 2007
Manuscript Accepted: December 6, 2007
Published: February 13, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Gaelle Georges, Laurent Arnaud, Laure Siozade, Nora Le Neindre, Frédéric Chazallet, Myriam Zerrad, Carole Deumié, and Claude Amra, "From angle-resolved ellipsometry of light scattering to imaging in random media," Appl. Opt. 47, C257-C265 (2008)

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