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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 13 — May. 1, 2008
  • pp: C279–C283

Efficiency of polarimetric z probing in optical multilayers

Claude Amra, Carole Deumié, Gaelle Georges, Catherine Grèzes-Besset, and Frédéric Chazallet  »View Author Affiliations

Applied Optics, Vol. 47, Issue 13, pp. C279-C283 (2008)

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Numerical calculation is performed to validate the principles of a single optical technique devoted to real time probing or imaging of submultilayers within interferential coatings.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: July 26, 2007
Revised Manuscript: December 10, 2007
Manuscript Accepted: December 11, 2007
Published: February 20, 2008

Claude Amra, Carole Deumié, Gaelle Georges, Catherine Grèzes-Besset, and Frédéric Chazallet, "Efficiency of polarimetric z probing in optical multilayers," Appl. Opt. 47, C279-C283 (2008)

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