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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 15 — May. 20, 2008
  • pp: 2798–2805

Photoluminescence emission profiles of Y 2 O 3 : Eu films composed of high–low density stacks produced by glancing angle deposition

James Gospodyn, Michael T. Taschuk, Peter C. P. Hrudey, Ying Y. Tsui, Robert Fedosejevs, Michael J. Brett, and Jeremy C. Sit  »View Author Affiliations


Applied Optics, Vol. 47, Issue 15, pp. 2798-2805 (2008)
http://dx.doi.org/10.1364/AO.47.002798


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Abstract

Periodic high-/low-index film stacks composed of Y 2 O 3 : Eu were grown by glancing angle deposition on silicon and fused silica substrates. Postdeposition annealing at temperatures from 600 to 1000 ° C for 1     h in air was performed to activate photoluminescence. Absolute photoluminescence spectra were obtained as a function of observation angle. The angular emission distribution was non-Lambertian, with peak emission at angles of 50 ° to 60 ° with respect to substrate normal. Spectroscopic transmittance and ellipsometry measurements were performed to characterize the films. Using this description, we were able to reproduce the angular photoluminescence patterns of the films.

© 2008 Optical Society of America

OCIS Codes
(160.2540) Materials : Fluorescent and luminescent materials
(160.5690) Materials : Rare-earth-doped materials
(230.1480) Optical devices : Bragg reflectors
(230.4000) Optical devices : Microstructure fabrication
(310.1860) Thin films : Deposition and fabrication
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Materials

History
Original Manuscript: December 6, 2007
Revised Manuscript: April 24, 2008
Manuscript Accepted: April 28, 2008
Published: May 14, 2008

Citation
James Gospodyn, Michael T. Taschuk, Peter C. P. Hrudey, Ying Y. Tsui, Robert Fedosejevs, Michael J. Brett, and Jeremy C. Sit, "Photoluminescence emission profiles of Y2O3:Eu films composed of high-low density stacks produced by glancing angle deposition," Appl. Opt. 47, 2798-2805 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-15-2798

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