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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 16 — Jun. 1, 2008
  • pp: 3032–3040

Three-dimensional mapping and range measurement by means of projected speckle patterns

Javier García, Zeev Zalevsky, Pascuala García-Martínez, Carlos Ferreira, Mina Teicher, and Yevgeny Beiderman  »View Author Affiliations


Applied Optics, Vol. 47, Issue 16, pp. 3032-3040 (2008)
http://dx.doi.org/10.1364/AO.47.003032


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Abstract

We present a novel approach for three-dimensional (3D) measurements that includes the projection of coherent light through ground glass. Such a projection generates random speckle patterns on the object or on the camera, depending if the configuration is transmissive or reflective. In both cases the spatially random patterns are seen by the sensor. Different spatially random patterns are generated at different planes. The patterns are highly random and not correlated. This low correlation between different patterns is used for both 3D mapping of objects and range finding.

© 2008 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(100.6890) Image processing : Three-dimensional image processing
(110.6150) Imaging systems : Speckle imaging

ToC Category:
Image Processing

History
Original Manuscript: November 15, 2007
Revised Manuscript: March 27, 2008
Manuscript Accepted: May 9, 2008
Published: May 26, 2008

Citation
Javier García, Zeev Zalevsky, Pascuala García-Martínez, Carlos Ferreira, Mina Teicher, and Yevgeny Beiderman, "Three-dimensional mapping and range measurement by means of projected speckle patterns," Appl. Opt. 47, 3032-3040 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-16-3032

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