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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 17 — Jun. 10, 2008
  • pp: 3134–3142

Absolute phase-assisted three-dimensional data registration for a dual-camera structured light system

Song Zhang and Shing-Tung Yau  »View Author Affiliations

Applied Optics, Vol. 47, Issue 17, pp. 3134-3142 (2008)

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For a three-dimensional shape measurement system with a single projector and multiple cameras, registering patches from different cameras is crucial. Registration usually involves a complicated and time-consuming procedure. We propose a new method that can robustly match different patches via absolute phase without significantly increasing its cost. For y and z coordinates, the transformations from one camera to the other are approximated as third-order polynomial functions of the absolute phase. The x coordinates involve only translations and scalings. These functions are calibrated and only need to be determined once. Experiments demonstrated that the alignment error is within RMS 0.7 mm .

© 2008 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5800) Instrumentation, measurement, and metrology : Scanners

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 3, 2008
Revised Manuscript: April 10, 2008
Manuscript Accepted: May 2, 2008
Published: June 2, 2008

Song Zhang and Shing-Tung Yau, "Absolute phase-assisted three-dimensional data registration for a dual-camera structured light system," Appl. Opt. 47, 3134-3142 (2008)

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