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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 2 — Jan. 10, 2008
  • pp: 284–295

Crystallography of ordered colloids using optical microscopy. 1. Parallel-beam technique

Richard B. Rogers and K. Peter D. Lagerlöf  »View Author Affiliations

Applied Optics, Vol. 47, Issue 2, pp. 284-295 (2008)

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A technique is described for determining the reciprocal lattice basis vectors of randomly oriented colloidal crystals from optical Fourier transform images using a parallel incident beam. This approach is demonstrated by comparing information gathered using this technique with results from real-space images for a single colloidal crystal grain with a random hexagonal close-packed structure. The reciprocal space and available real-space results agreed to within experimental error. The complete set of reciprocal lattice basis vectors was determined using the proposed technique in contrast to the partial lattice information available from real-space images. This technique appears to be generally capable of measuring lattice parameters to within 1% and orientation to better than 1°.

© 2008 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(050.5298) Diffraction and gratings : Photonic crystals

ToC Category:

Original Manuscript: July 26, 2007
Revised Manuscript: November 28, 2007
Manuscript Accepted: November 29, 2007
Published: January 9, 2008

Richard B. Rogers and K. Peter D. Lagerlöf, "Crystallography of ordered colloids using optical microscopy. 1. Parallel-beam technique," Appl. Opt. 47, 284-295 (2008)

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