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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 21 — Jul. 20, 2008
  • pp: 3784–3788

Phase-shifting interferometer based on changing the direction of linear polarization orthogonally

Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya  »View Author Affiliations

Applied Optics, Vol. 47, Issue 21, pp. 3784-3788 (2008)

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We present a new type of phase-shifting interferometer, which utilizes a polarizing prism to form quadrature phase-shifted fringe patterns onto a single imaging sensor. By changing the direction of linear polarization of the incident light orthogonally, four phase-shifted fringe patterns in quadrature are obtained by taking images twice; thus it is possible to reduce phase errors caused by mechanical vibrations and air turbulence that occur in temporal phase-shifting interferometers. We present the principle of this interferometer with its theoretical analysis, using the Jones matrix, along with experimental results.

© 2008 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 3, 2008
Revised Manuscript: May 12, 2008
Manuscript Accepted: June 13, 2008
Published: July 14, 2008

Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya, "Phase-shifting interferometer based on changing the direction of linear polarization orthogonally," Appl. Opt. 47, 3784-3788 (2008)

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