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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 23 — Aug. 10, 2008
  • pp: 4205–4211

Kramers–Kronig-constrained variational dielectric fitting and the reflectance of a thin film on a substrate

D. A. Crandles, F. Eftekhari, R. Faust, G. S. Rao, M. Reedyk, and F. S. Razavi  »View Author Affiliations


Applied Optics, Vol. 47, Issue 23, pp. 4205-4211 (2008)
http://dx.doi.org/10.1364/AO.47.004205


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Abstract

A test was made of the ability of Kramers–Kronig-constrained variational dielectric fitting to extract the optical conductivity of a thin film from reflectance data containing structure due to both thin film and substrate. The reflectance of a series of well-characterized thin films of Sr Ru x Mg 1 x O 3 and Sr Ru x O 3 with a variety of thicknesses ( 56 300 nm ) and dc resistivities ( 250 2200 μΩcm ) was measured. The low frequency values of the extracted optical conductivities agree with the dc measurements, however, removal of features due to the substrate improves with increasing film thickness.

© 2008 Optical Society of America

OCIS Codes
(300.6270) Spectroscopy : Spectroscopy, far infrared
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: June 13, 2008
Manuscript Accepted: June 23, 2008
Published: August 4, 2008

Citation
D. A. Crandles, F. Eftekhari, R. Faust, G. S. Rao, M. Reedyk, and F. S. Razavi, "Kramers-Kronig-constrained variational dielectric fitting and the reflectance of a thin film on a substrate," Appl. Opt. 47, 4205-4211 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-23-4205

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