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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 25 — Sep. 1, 2008
  • pp: 4589–4597

On-shot focal-spot characterization technique using phase retrieval

Seung-Whan Bahk, Jake Bromage, Ildar A. Begishev, Chad Mileham, Christian Stoeckl, Michael Storm, and Jonathan D. Zuegel  »View Author Affiliations


Applied Optics, Vol. 47, Issue 25, pp. 4589-4597 (2008)
http://dx.doi.org/10.1364/AO.47.004589


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Abstract

We present an on-shot focal-spot characterization technique based on a phase-retrieval scheme that retrieves near-field phase from multiplane focal-spot measurements in an experimental target chamber. The technique is easy to implement inside a target chamber and is demonstrated in a multiterawatt laser system. It is also found that phase retrieval can quantitatively detect residual angular dispersion coming from the pulse compressor misalignment.

© 2008 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.7100) Ultrafast optics : Ultrafast measurements
(140.3295) Lasers and laser optics : Laser beam characterization

ToC Category:
Image Processing

History
Original Manuscript: May 16, 2008
Manuscript Accepted: July 5, 2008
Published: August 28, 2008

Citation
Seung-Whan Bahk, Jake Bromage, Ildar A. Begishev, Chad Mileham, Christian Stoeckl, Michael Storm, and Jonathan D. Zuegel, "On-shot focal-spot characterization technique using phase retrieval," Appl. Opt. 47, 4589-4597 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-25-4589

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