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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 26 — Sep. 10, 2008
  • pp: 4723–4728

High resolution Talbot self-imaging applied to structural characterization of self-assembled monolayers of microspheres

J. Garcia-Sucerquia, D. C. Alvarez-Palacio, and H. J. Kreuzer  »View Author Affiliations


Applied Optics, Vol. 47, Issue 26, pp. 4723-4728 (2008)
http://dx.doi.org/10.1364/AO.47.004723


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Abstract

We report the observation of the Talbot self-imaging effect in high resolution digital in-line holographic microscopy (DIHM) and its application to structural characterization of periodic samples. Holograms of self-assembled monolayers of micron-sized polystyrene spheres are reconstructed at different image planes. The point-source method of DIHM and the consequent high lateral resolution allows the true image (object) plane to be identified. The Talbot effect is then exploited to improve the evaluation of the pitch of the assembly and to examine defects in its periodicity.

© 2008 Optical Society of America

OCIS Codes
(090.1760) Holography : Computer holography
(100.6640) Image processing : Superresolution
(180.6900) Microscopy : Three-dimensional microscopy
(090.1995) Holography : Digital holography

ToC Category:
Holography

History
Original Manuscript: July 10, 2008
Revised Manuscript: August 11, 2008
Manuscript Accepted: August 11, 2008
Published: September 9, 2008

Citation
J. Garcia-Sucerquia, D. C. Alvarez-Palacio, and H. J. Kreuzer, "High resolution Talbot self-imaging applied to structural characterization of self-assembled monolayers of microspheres," Appl. Opt. 47, 4723-4728 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-26-4723

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