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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 26 — Sep. 10, 2008
  • pp: 4787–4792

Simultaneous formation of four fringes by using a polarization quadrature phase-shifting interferometer with wave plates and a diffraction grating

Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya  »View Author Affiliations

Applied Optics, Vol. 47, Issue 26, pp. 4787-4792 (2008)

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We present a new type of quadrature phase-shifting interferometer, which utilizes wave plates, a diffraction grating, and two lasers with different wavelengths, in order to acquire two sets of two quadrature fringe patterns in each wavelength formed on a single image sensor. This method for calculating with four phase-shifted fringe patterns gives us the phase sum and difference distributions between the phases in two wavelengths. This is also substantiated by results of our experiments.

© 2008 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 19, 2008
Revised Manuscript: July 30, 2008
Manuscript Accepted: July 31, 2008
Published: September 9, 2008

Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya, "Simultaneous formation of four fringes by using a polarization quadrature phase-shifting interferometer with wave plates and a diffraction grating," Appl. Opt. 47, 4787-4792 (2008)

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