OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 26 — Sep. 10, 2008
  • pp: 4787–4792

Simultaneous formation of four fringes by using a polarization quadrature phase-shifting interferometer with wave plates and a diffraction grating

Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya  »View Author Affiliations


Applied Optics, Vol. 47, Issue 26, pp. 4787-4792 (2008)
http://dx.doi.org/10.1364/AO.47.004787


View Full Text Article

Enhanced HTML    Acrobat PDF (3914 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a new type of quadrature phase-shifting interferometer, which utilizes wave plates, a diffraction grating, and two lasers with different wavelengths, in order to acquire two sets of two quadrature fringe patterns in each wavelength formed on a single image sensor. This method for calculating with four phase-shifted fringe patterns gives us the phase sum and difference distributions between the phases in two wavelengths. This is also substantiated by results of our experiments.

© 2008 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 19, 2008
Revised Manuscript: July 30, 2008
Manuscript Accepted: July 31, 2008
Published: September 9, 2008

Citation
Tomohiro Kiire, Suezou Nakadate, and Masato Shibuya, "Simultaneous formation of four fringes by using a polarization quadrature phase-shifting interferometer with wave plates and a diffraction grating," Appl. Opt. 47, 4787-4792 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-26-4787


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, “Digital wavefront measuring interferometer for testing optical surfaces and lenses,” Appl. Opt. 13, 2693-2703 (1974). [CrossRef] [PubMed]
  2. I. Yamaguchi and T. Zhang, “Phase-shifting digital holography,” Opt. Lett. 22, 1268-1270 (1997). [CrossRef] [PubMed]
  3. S. Nakadate and H. Saito, “Fringe scanning speckle-pattern interferometry,” Appl. Opt. 24, 2172-2180 (1985). [CrossRef] [PubMed]
  4. H. Schreiber and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), pp. 547-666. [CrossRef]
  5. A. J. P. van Haasteren and H. J. Frankena, “Real-time displacement measurement using a multicamera phase-stepping speckle interferometer,” Appl. Opt. 33, 4137-4142 (1994). [CrossRef]
  6. S. Nakadate and M. Isshiki, “Real-time fringe pattern processing and its applications,” Proc. SPIE 2544, 74-86 (1995).
  7. A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39, 960-966 (2000). [CrossRef]
  8. J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304-314 (2004). [CrossRef]
  9. Y. Awatsuji, M. Sasada, and T. Kubota, “Parallel quasi-phase-shifting digital holography,” Appl. Phys. Lett. 85, 1069-1071(2004). [CrossRef]
  10. M. Sasada, Y. Awatsuji, and T. Kubota, “Parallel quasi-phase-shifting digital holography implemented by simple optical set up and effective use of image-sensor pixels,” in Technical Digest of 2004 ICO International Conference Optics and Photonics in Technology Frontier (International Commission for Optics, 2004), pp. 357-358.
  11. M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156-160(1982). [CrossRef]
  12. D. Kerr, F. Mendoza Santoyo, and J. R. Tyrer, “Extraction of phase data from electronic speckle pattern interferometric fringes using a single-phase-step method: a novel approach,” J. Opt. Soc. Am. A 7, 820-826 (1990). [CrossRef]
  13. S. Almazan-Cuellar and D. Malacara-Hernandez, “Two-step phase-shifting algorithm,” Opt. Eng. 42, 3524-3531 (2003). [CrossRef]
  14. S. Nakadate, T. Kiire, K. Shiozawa, and M. Shibuya, “Phase-shifting interferometer using two phase-shifted fringe patterns in quadrature,” Jpn. J. Opt. 33, 407-412 (2004).
  15. X. F. Meng, L. Z. Cai, X. F. Xu, X. L. Yang, X. X. Shen, G. Y. Dong, and Y. R. Wang, “Two-step phase-shifting interferometry and its application in image encryption,” Opt. Lett. 31, 1414-1416 (2006). [CrossRef] [PubMed]
  16. Q. Kemao and S. Hock Soon, “Sequential demodulation of a single fringe pattern guided by local frequencies,” Opt. Lett. 32, 127-129 (2007). [CrossRef]
  17. F. Yang and X. He, “Two-step phase-shifting fringe projection profilometry: intensity derivative approach,” Appl. Opt. 46, 7172-7178 (2007). [CrossRef] [PubMed]
  18. K. Onuma, T. Kameyama, and K. Tsukamoto, “In situ study of surface phenomena by real time phase shift interferometry,” J. Cryst. Growth 137, 610-622 (1994). [CrossRef]
  19. N. Brock, J. Hayes, B. Kimbrough, J. Millerd, M. North-Morris, M. Novak, and J. Wyant, “Dynamic interferometry,” Proc. SPIE 5875, 5875F (2005).
  20. Y. Y. Cheng and J. C. Wyant, “Two-wavelength phase shifting interferometry,” Appl. Opt. 23, 4539-4543 (1984). [CrossRef] [PubMed]
  21. M. B. North-Morris, J. E. Millerd, N. J. Brock, and J. B. Hayes, “Phase-shifting multi-wavelength dynamic interferometer,” Proc. SPIE 5531, 64-75 (2004). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited