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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 27 — Sep. 20, 2008
  • pp: 4878–4883

In-line broadband 270 ° ( 3 λ / 4 ) chevron four-reflection wave retarders

R. M. A. Azzam and H. K. Khanfar  »View Author Affiliations


Applied Optics, Vol. 47, Issue 27, pp. 4878-4883 (2008)
http://dx.doi.org/10.1364/AO.47.004878


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Abstract

The net differential phase shift Δ t introduced between the orthogonal p and s linear polarizations after four successive total internal reflections inside an in-line chevron dual-Fresnel-rhomb retarder is a function of the first internal angle of incidence φ and prism refractive index n. Retardance of 3 λ / 4 (i.e., Δ t = 270 ° ) is achieved with minimum angular sensitivity when φ = 45 ° and n = 1.900822 . Several optical glasses with this refractive index are identified. For Schott glass SF66 the deviation of Δ t from 270 ° is 4 ° over a wave length range of 0.55 λ 1.1 μm in the visible and near-IR spectrum. For a SiC prism, whose totally reflecting surfaces are coated with an optically thick Mg F 2 film, Δ t = 270 ° at two wavelengths: λ 1 = 0.707 μm and λ 2 = 4.129 μm . This coated prism has a maximum retardance error of 5 ° over > three octaves (0.5 to 4.5 μm ) in the visible, near-, and mid-IR spectral range. Another mid-IR 3 λ / 4 retarder uses a Si prism, which is coated by an optically thick silicon oxynitride film of the proper composition, to achieve retardance that differs from 270 ° by < 0.5 ° over the 3 5 μm spectral range.

© 2008 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(230.5440) Optical devices : Polarization-selective devices
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.3060) Physical optics : Infrared
(260.5430) Physical optics : Polarization
(310.1620) Thin films : Interference coatings

ToC Category:
Optical Devices

History
Original Manuscript: June 25, 2008
Manuscript Accepted: August 10, 2008
Published: September 12, 2008

Citation
R. M. A. Azzam and H. K. Khanfar, "In-line broadband 270° (3λ/4) chevron four-reflection wave retarders," Appl. Opt. 47, 4878-4883 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-27-4878


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References

  1. M. Born and E. Wolf, Principles of Optics (Cambridge, 1999).
  2. R. J. King, “Quarter-wave retardation systems based on the Fresnel rhomb principle,” J. Sci. Instrum. 43, 617-622 (1966). [CrossRef]
  3. J. M. Bennett, “Critical evaluation of rhomb-type quarter-wave retarders,” Appl. Opt. 9, 2123-2129 (1970). [CrossRef] [PubMed]
  4. I. Filinski and T. Skettrup, “Achromatic phase retarders constructed from right-angle prisms: design,” Appl. Opt. 23, 2747-2751 (1984). [CrossRef] [PubMed]
  5. E. Spiller, “Totally reflecting thin-film phase retarders,” Appl. Opt. 23, 3544-3549 (1984). [CrossRef] [PubMed]
  6. A. M. Kan'an and R. M. A. Azzam, “In-line quarter-wave retarders for the IR using total refraction and total internal reflection in a prism,” Opt. Eng. 33, 2029-2033 (1994). [CrossRef]
  7. E. Cojocaru, “Simple relations for thin-film-coated phase-retarding totally reflecting prisms,” Appl. Opt. 33, 2678-2682 (1994). [CrossRef] [PubMed]
  8. R. M. A. Azzam and M. M. K. Howlader, “Silicon-based polarization optics for the 1.30 and 1.55 μm communication wavelengths,” J. Lightwave Technol. 14, 873-878 (1996). [CrossRef]
  9. R. M. A. Azzam and C. L. Spinu, “Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface,” J. Opt. Soc. Am. A 21, 2019-2022(2004). [CrossRef]
  10. R. M. A. Azzam and H. K. Khanfar, “Polarization properties of retroreflecting right-angle prisms,” Appl. Opt. 47, 359-364(2008). [CrossRef] [PubMed]
  11. http://www.us.schott.com/optics_devices/english/products/flash/abbediagramm_flash.html.
  12. http://www.ohara-inc.co.jp/en/product/optical/opticalglass/data.html.
  13. W. J. Tropf and M. E. Thomas, “Infrared refractive index and thermo-optic coefficient measurement at APL,” Johns Hopkins APL Tech. Dig. 19, 293-298 (1998).
  14. W. J. Tropf, M. E. Thomas, and T. J. Harris, “Properties of crystals and glasses,” in Handbook of Optics, M. Bass, E. W. Van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, 1995), Chap. 33, Vol. 2.
  15. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1987).
  16. T. Bååk, “Silicon oxynitride: a material for GRIN optics,” Appl. Opt. 21, 1069-1072 (1982). [CrossRef] [PubMed]
  17. W. L. Wolfe and G. J. Zissis, eds., The Infrared Handbook (Office of Naval Research, 1978).

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