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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 27 — Sep. 20, 2008
  • pp: 4888–4894

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

Emre Coşkun, Kıvanç Sel, Serhat Özder, and Mustafa Kurt  »View Author Affiliations


Applied Optics, Vol. 47, Issue 27, pp. 4888-4894 (2008)
http://dx.doi.org/10.1364/AO.47.004888


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Abstract

We present the continuous wavelet transform (CWT) method for determining the dispersion curves of the refractive index and extinction coefficient of absorbing thin films by using the transmittance spectrum in the visible and near infrared regions at room temperature. The CWT method is performed on the transmittance spectrum of an a Si 1 x C x :H film, and the refractive index and extinction coefficient of the film are continuously determined and compared with the results of the envelope and fringe counting methods. Also the noise filter property of the method is depicted on a theoretically generated noisy signal. Finally, the error analyses of the CWT, envelope, and fringe counting methods are performed.

© 2008 Optical Society of America

OCIS Codes
(070.4560) Fourier optics and signal processing : Data processing by optical means
(070.4790) Fourier optics and signal processing : Spectrum analysis
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Fourier Optics and Signal Processing

History
Original Manuscript: June 4, 2008
Revised Manuscript: August 6, 2008
Manuscript Accepted: August 7, 2008
Published: September 15, 2008

Citation
Emre Coşkun, Kıvanç Sel, Serhat Özder, and Mustafa Kurt, "Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method," Appl. Opt. 47, 4888-4894 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-27-4888

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