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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 27 — Sep. 20, 2008
  • pp: 4888–4894

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method

Emre Coşkun, Kıvanç Sel, Serhat Özder, and Mustafa Kurt  »View Author Affiliations

Applied Optics, Vol. 47, Issue 27, pp. 4888-4894 (2008)

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We present the continuous wavelet transform (CWT) method for determining the dispersion curves of the refractive index and extinction coefficient of absorbing thin films by using the transmittance spectrum in the visible and near infrared regions at room temperature. The CWT method is performed on the transmittance spectrum of an a Si 1 x C x :H film, and the refractive index and extinction coefficient of the film are continuously determined and compared with the results of the envelope and fringe counting methods. Also the noise filter property of the method is depicted on a theoretically generated noisy signal. Finally, the error analyses of the CWT, envelope, and fringe counting methods are performed.

© 2008 Optical Society of America

OCIS Codes
(070.4560) Fourier optics and signal processing : Data processing by optical means
(070.4790) Fourier optics and signal processing : Spectrum analysis
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Fourier Optics and Signal Processing

Original Manuscript: June 4, 2008
Revised Manuscript: August 6, 2008
Manuscript Accepted: August 7, 2008
Published: September 15, 2008

Emre Coşkun, Kıvanç Sel, Serhat Özder, and Mustafa Kurt, "Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet transform method," Appl. Opt. 47, 4888-4894 (2008)

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  1. R. Swanepoel, “Determination of the thickness and optical constants of amorphous silicon,” J. Phys. E 16, 1214-1222(1983). [CrossRef]
  2. O. Köysal, D. Önal, S. Özder, and F. N. Ecevit, “Thickness measurement of dielectric films by wavelength scanning method,” Opt. Commun. 205, 1-6 (2002). [CrossRef]
  3. K. H. Yang, “Measurements of empty cell gap for liquid-crystal displays using interferometric methods,” J. Appl. Phys. 64, 4780-4781 (1988). [CrossRef]
  4. R. Chang, “Application of polarimetry and interferometry to liquid crystal-film research,” Mater. Res. Bull. 7, 267-278(1972). [CrossRef]
  5. A. Grossman and J. Morlet, “Decomposition of Hardy functions into square integrable wavelets of constant shape,” SIAM J. Math. Anal. 15, 723-736 (1984). [CrossRef]
  6. M. Afifi, A. Fassi-Fihri, M. Marjane, K. Nassim, M. Sidki, and S. Rachafi, “Paul wavelet-based algorithm for optical phase distribution evaluation,” Opt. Commun. 211, 47-51 (2002). [CrossRef]
  7. S. D. Meyers, B. G. Kelly, and J. J. O'Brien, “An introduction to wavelet analysis in oceanography and meteorology: with application to the dispersion of Yanai waves,” Mon. Weather Rev. 121, 2858-2866 (1993). [CrossRef]
  8. G. B. Arfken, Mathematical Methods for Physicists (Academic, 1995).
  9. L. Angrisani, P. Daponte, and M. D'Apuzzo, “A method for the automatic detection and measurement of transients. Part I: the measurement method,” Measurement 25, 19-30 (1999). [CrossRef]
  10. P. S. Addison, “Wavelet transforms and the ECG: a review,” Physiol. Meas. 26, R155-R199 (2005). [CrossRef] [PubMed]
  11. D. Lagoutte, J. C. Cerisier, J. L. Plagnaud, J. P. Villain, and B. Forget, “High latitude ionosphere turbulence studied by means of the wavelet transform,” J. Atmos. Terr. Phys. 54, 1283-1293 (1992). [CrossRef]
  12. C. Torrence and G. P. Compo, “A practical guide to wavelet analysis,” Bull. Am. Meteorol. Soc. 79, 61-78 (1998). [CrossRef]
  13. M. Farge, “Wavelet transforms and their applications to turbulence,” Annu. Rev. Fluid Mech. 24, 395-457 (1992). [CrossRef]
  14. O. Köysal, S. E. San, S. Özder, and F. N. Ecevit, “A novel approach for the determination of birefringence dispersion in nematic liquid crystals by using the continuous wavelet transform,” Meas. Sci. Technol. 14, 790-795 (2003). [CrossRef]

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