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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 28 — Oct. 1, 2008
  • pp: 5167–5174

Analysis of interferograms from a diffractive-lens-based common-path interferometer

Ismo Vartiainen, Pasi Vahimaa, and Markku Kuittinen  »View Author Affiliations


Applied Optics, Vol. 47, Issue 28, pp. 5167-5174 (2008)
http://dx.doi.org/10.1364/AO.47.005167


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Abstract

We present a method of numerical analysis of interferograms for a diffractive-lens-based common-path interferometer recently introduced by Elfström et al. [Opt. Express 14, 3847 (2006)]. Practical aspects such as the effect of higher diffraction orders upon the interferograms are considered. We show that this method can be used to solve the phase function of the inspected lens. In addition, we show that by using this method it is possible to estimate the focal length and imaging properties of the inspected lens.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(050.1965) Diffraction and gratings : Diffractive lenses

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 4, 2008
Revised Manuscript: August 12, 2008
Manuscript Accepted: August 25, 2008
Published: September 25, 2008

Citation
Ismo Vartiainen, Pasi Vahimaa, and Markku Kuittinen, "Analysis of interferograms from a diffractive-lens-based common-path interferometer," Appl. Opt. 47, 5167-5174 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-28-5167

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