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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 28 — Oct. 1, 2008
  • pp: F85–F95

Analysis of computed tomographic imaging spectrometers. I. Spatial and spectral resolution

Nathan Hagen and Eustace L. Dereniak  »View Author Affiliations


Applied Optics, Vol. 47, Issue 28, pp. F85-F95 (2008)
http://dx.doi.org/10.1364/AO.47.000F85


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Abstract

Computed tomographic imaging spectrometers measure the spectrally resolved image of an object scene in an entirely different manner from traditional whisk-broom or push-broom systems, and thus their noise behavior and data artifacts are unfamiliar. We review computed tomographic imaging spectrometry (CTIS) measurement systems and analyze their performance, with the aim of providing a vocabulary for discussing resolution in CTIS instruments, by illustrating the artifacts present in their reconstructed data and contributing a rule-of-thumb measure of their spectral resolution. We also show how the data reconstruction speed can be improved, at no cost in reconstruction quality, by ignoring redundant projections within the measured raw images.

© 2008 Optical Society of America

OCIS Codes
(110.3000) Imaging systems : Image quality assessment
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6190) Spectroscopy : Spectrometers
(110.4234) Imaging systems : Multispectral and hyperspectral imaging

ToC Category:
Spectral Imaging Sensors

History
Original Manuscript: March 7, 2008
Revised Manuscript: April 22, 2008
Manuscript Accepted: May 30, 2008
Published: July 25, 2008

Citation
Nathan Hagen and Eustace L. Dereniak, "Analysis of computed tomographic imaging spectrometers. I. Spatial and spectral resolution," Appl. Opt. 47, F85-F95 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-28-F85


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References

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