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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5272–5280

Multiscale analysis of the laser-induced damage threshold in optical coatings

Jérémie Capoulade, Laurent Gallais, Jean-Yves Natoli, and Mireille Commandré  »View Author Affiliations

Applied Optics, Vol. 47, Issue 29, pp. 5272-5280 (2008)

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We have investigated the influence of laser beam size on laser-induced damage threshold (LIDT) in the case of single- and multiple-shot irradiation. The study was performed on hafnia thin films deposited with various technologies (evaporation, sputtering, with or without ion assistance). LIDT measurements were carried out at 1064 nm and 12 ns with a spot size ranging from a few tens to a few hundreds of micrometers, in 1-on-1 and R-on-1 modes. These measurements were compared with simulations obtained with the statistical theory of laser-induced damage caused by initiating inclusions.We show how to obtain information on the initiating defect properties and the related physical damage mechanisms with a multiscale study. Under certain conditions, it is possible with this method to discriminate different defects, estimate their densities, and follow the evolution of the defects under multiple irradiation. The different metrology implications of our approach, particularly for obtaining a functional LIDT of optical components are discussed.

© 2008 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(310.0310) Thin films : Thin films

ToC Category:
Thin Films

Original Manuscript: April 29, 2008
Revised Manuscript: July 29, 2008
Manuscript Accepted: August 5, 2008
Published: October 3, 2008

Jérémie Capoulade, Laurent Gallais, Jean-Yves Natoli, and Mireille Commandré, "Multiscale analysis of the laser-induced damage threshold in optical coatings," Appl. Opt. 47, 5272-5280 (2008)

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