OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5400–5407

Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera

Shien Ri, Motoharu Fujigaki, and Yoshiharu Morimoto  »View Author Affiliations


Applied Optics, Vol. 47, Issue 29, pp. 5400-5407 (2008)
http://dx.doi.org/10.1364/AO.47.005400


View Full Text Article

Enhanced HTML    Acrobat PDF (13039 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Phase-measuring profilometry is an accurate and effective technique for performing three-dimensional (3D) shape and deformation measurements of diffuse objects by fringe projection. However, phase analysis cannot be performed in underexposed or overexposed areas of the detector when an object with wide reflectance is measured. A novel intensity range extension method using a digital micromirror device (DMD) camera is proposed. In the optics of the DMD camera, each pixel of the CCD corresponds exactly to each mirror of the DMD. The phase-shifted fringe patterns with high contrast can be easily captured by programming an inverse intensity pattern that depends on the reflectance of the object. Our method can provide a wider intensity range and higher accuracy for 3D shape measurement than other conventional methods in both underexposed and overexposed areas. The measurements of a replica of a metallic art object and a flat plane are analyzed experimentally to verify the effectiveness of our method. In the experiment, the percentage of invalid points due to underexposure and overexposure can be reduced from 20% to 1%.

© 2008 Optical Society of America

OCIS Codes
(100.2980) Image processing : Image enhancement
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Image Processing

History
Original Manuscript: June 17, 2008
Revised Manuscript: August 27, 2008
Manuscript Accepted: September 2, 2008
Published: October 8, 2008

Citation
Shien Ri, Motoharu Fujigaki, and Yoshiharu Morimoto, "Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera," Appl. Opt. 47, 5400-5407 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-29-5400

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited