OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5400–5407

Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera

Shien Ri, Motoharu Fujigaki, and Yoshiharu Morimoto  »View Author Affiliations


Applied Optics, Vol. 47, Issue 29, pp. 5400-5407 (2008)
http://dx.doi.org/10.1364/AO.47.005400


View Full Text Article

Enhanced HTML    Acrobat PDF (13039 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Phase-measuring profilometry is an accurate and effective technique for performing three-dimensional (3D) shape and deformation measurements of diffuse objects by fringe projection. However, phase analysis cannot be performed in underexposed or overexposed areas of the detector when an object with wide reflectance is measured. A novel intensity range extension method using a digital micromirror device (DMD) camera is proposed. In the optics of the DMD camera, each pixel of the CCD corresponds exactly to each mirror of the DMD. The phase-shifted fringe patterns with high contrast can be easily captured by programming an inverse intensity pattern that depends on the reflectance of the object. Our method can provide a wider intensity range and higher accuracy for 3D shape measurement than other conventional methods in both underexposed and overexposed areas. The measurements of a replica of a metallic art object and a flat plane are analyzed experimentally to verify the effectiveness of our method. In the experiment, the percentage of invalid points due to underexposure and overexposure can be reduced from 20% to 1%.

© 2008 Optical Society of America

OCIS Codes
(100.2980) Image processing : Image enhancement
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Image Processing

History
Original Manuscript: June 17, 2008
Revised Manuscript: August 27, 2008
Manuscript Accepted: September 2, 2008
Published: October 8, 2008

Citation
Shien Ri, Motoharu Fujigaki, and Yoshiharu Morimoto, "Intensity range extension method for three-dimensional shape measurement in phase-measuring profilometry using a digital micromirror device camera," Appl. Opt. 47, 5400-5407 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-29-5400


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. F. Chen, G. M. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000). [CrossRef]
  2. J. S. Massa, G. S. Buller, A. C. Walker, S. Cova, M. Umasuthan, and A. M. Wallace, “Time-of-flight optical ranging system based on time-correlated single-photon counting,” Appl. Opt. 37, 7298-7304 (1998). [CrossRef]
  3. C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Shape measurement by use of temporal Fourier transformation in dual-beam illumination speckle interferometry,” Appl. Opt. 37, 3385-3390 (1998). [CrossRef]
  4. E. A. Barbosa and A. Lino, “Multiwavelength electronic speckle pattern interferometry for surface shape measurement,” Appl. Opt. 46, 2624-2631 (2007). [CrossRef]
  5. I. Yamaguchi, T. Ida, M. Yokota, and K. Yamashita, “Surface shape measurement by phase-shifting digital holography with a wavelength shift,” Appl. Opt. 45, 7610-7616 (2006). [CrossRef]
  6. H. O. Saldner and J. M. Huntley, “Profilometry by temporal phase unwrapping and spatial light modulator based fringe projector,” Opt. Eng. 36, 610-615 (1997). [CrossRef]
  7. S. Kakunai, T. Sakamoto, and K. Iwata, “Profile measurement taken with liquid-crystal gratings,” Appl. Opt. 38, 2824-2828 (1999). [CrossRef]
  8. P. Carre, “Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures,” Metrologia 2, 13-23 (1966). [CrossRef]
  9. J. C. Wyant, “Interferometry optical metrology: basic principles and new systems,” Laser Focus 65-71 (1982).
  10. J. C. Wyant, C. L. Koliopoulos, B. Bhushan, and O. E. George, “An optical profilometry for surface characterization of magnetic media,” Tribol. Trans. 27, 101-113 (1984). [CrossRef]
  11. P. Hariharan, “Phase-shifting interferometry: minimization of systematic errors,” Opt. Eng. 39, 967-969 (2000). [CrossRef]
  12. P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26, 2504-2506 (1987).
  13. P. D. Groot, “Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window,” Appl. Opt. 34, 4723-4730 (1995).
  14. Y. Morimoto, M. Fujigaki, and H. Toda, “Real-time shape measurement by integrated phase-shifting method,” Proc. SPIE 3744, 118-125 (1999).
  15. M. Fujigaki and Y. Morimoto, “Accuracy of real-time shape measurement by phase-shifting grid method using correlation,” JSME Int. J., Ser. A 43, 314-320 (2000).
  16. Y. Morimoto and M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 3709-3714 (1994). [CrossRef]
  17. K. P. Proll, J. M. Nivet, C. Voland, and H. J. Tiziani, “Enhancement of the dynamic range of the detected intensity in an optical measurement system by a three-channel technique,” Appl. Opt. 41, 130-135 (2002). [CrossRef]
  18. S. K. Nayar and V. Branzoi, “Adaptive dynamic range imaging: optical control of pixel exposures over space and time,” Ninth IEEE International Conference on Computer Vision (ICCV'03) (IEEE Computer Society, 2003), Vol. 2, 1168-1175
  19. S. Ri, M. Fujigaki, and Y. Morimoto, “Phase reliability evaluation in phase-shifting method using Fourier transform for shape measurement,” Opt. Eng. 44083601 (2005). [CrossRef]
  20. Y. Morimoto and M. Fujigaki, “Means and equipment of real-time shape measurement using a DMD reflection-type CCD camera,” Japan patent 3507865 (9 January 2004).
  21. Q. Gao, M. Fujigaki, and Y. Morimoto, “Application of digital micro-mirror device to deformation measurement,” Key Eng. Mater. 243-244, 189-194 (2003).
  22. S. Ri, Y. Matsunaga, M. Fujigaki, T. Matui, and Y. Morimoto, “Development of DMD reflection-type CCD camera for phase analysis and shape measurement,” J. Robot. Mechatron. 18, 728-737 (2005).
  23. L. J. Hornbeck, “Deformable-mirror spatial light modulators,” Proc. SPIE 1150, 86-102 (1990).
  24. J. B. Sampsell, “An overview of the digital micromirror device (DMD) and its application to projection displays,” in SID International Symposium Digest of Technical Papers (Society for Information Display, 1993), Vol. 24, pp. 1012-1015.
  25. L. J. Hornbeck, “Digital light processing for high-brightness, high-resolution applications,” Proc. SPIE 3013, 27-40 (1997).
  26. J. M. Florence and L. A. Yoder, “Display system architectures for digital micromirror device (DMD) based projectors,” Proc. SPIE 2650, 193-208 (1996).
  27. S. Ri, M. Fujigaki, T. Matui, and Y. Morimoto, “Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method,” Appl. Opt. 45, 6940-6946 (2006). [CrossRef]
  28. S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” submitted to Exp. Mech. .
  29. W. Osten, T. Haist, and K. Korner, “Active approaches in optical metrology,” in Proceedings of International Conference On Laser Applications and Optical Metrology, C. Shakher and D. S. Mehta, eds. (Anamaya, 2003), pp. 9-19
  30. R. Hofling and E. Ahl, “ALP: universal DMD controller for metrology and testing,” Proc. SPIE 5289B, 322-329(2004).
  31. K. Kinnstaetter, A. W. Lohmann, J. Schwider, and N. Streibl, “Accuracy of phase shifting interferometry,” Appl. Opt. 27, 5082-5089 (1988).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited