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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5454–5467

Design of an instrument for measuring the spectral bidirectional scatter distribution function

Frédéric B. Leloup, Stefaan Forment, Philip Dutré, Michael R. Pointer, and Peter Hanselaer  »View Author Affiliations

Applied Optics, Vol. 47, Issue 29, pp. 5454-5467 (2008)

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The spectral bidirectional scatter distribution function (BSDF) offers a complete description of the spectral and spatial optical characteristics of a material. Any gloss and color measurement can be related to a particular value of the BSDF, while accurate luminaire design with ray tracing software requires the BSDF of reflectors and filters. Many measuring instruments, each having particular advantages and limitations, have been reported in the literature, and an overview of these instruments is included. A measuring instrument that allows for an absolute determination of the spectral BSDF with a full three dimensional spatial coverage in both reflectance and transmittance mode, a broadband spectral coverage, a large dynamic range, a reasonable acquisition time, and a large sample illumination area is presented. The main instrument characteristics are discussed, and the measurement capabilities are illustrated.

© 2008 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.1483) Scattering : BSDF, BRDF, and BTDF
(290.5845) Scattering : Scattering, out-of-field

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 16, 2008
Manuscript Accepted: August 17, 2008
Published: October 8, 2008

Frédéric B. Leloup, Stefaan Forment, Philip Dutré, Michael R. Pointer, and Peter Hanselaer, "Design of an instrument for measuring the spectral bidirectional scatter distribution function," Appl. Opt. 47, 5454-5467 (2008)

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