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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 29 — Oct. 10, 2008
  • pp: 5473–5491

Dual-wavelength low-coherence instantaneous phase-shifting interferometer to measure the shape of a segmented mirror with subnanometer precision

Rainer Wilhelm, Bruno Luong, Alain Courteville, Sébastien Estival, Frédéric Gonté, and Nicolas Schuhler  »View Author Affiliations


Applied Optics, Vol. 47, Issue 29, pp. 5473-5491 (2008)
http://dx.doi.org/10.1364/AO.47.005473


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Abstract

We present a noncontact optical metrology measuring the pistons and tip/tilt angles of the 61 hexagonal segments of a compact-sized segmented mirror. The instrument has been developed within the scope of a design study for the European Extremely Large Telescope (E-ELT). It is used as reference sensor for cophasing of the mirror segments in closed-loop control. The mirror shape is also measured by different types of stellar light-based phasing cameras whose performances will be evaluated with regard to a future E-ELT. Following a description of the system architecture, the second part of the paper presents experimental results demonstrating the achieved precision: 0.48 nm rms in piston and 74 nrad rms in tip/tilt.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 1, 2008
Manuscript Accepted: August 6, 2008
Published: October 8, 2008

Citation
Rainer Wilhelm, Bruno Luong, Alain Courteville, Sébastien Estival, Frédéric Gonté, and Nicolas Schuhler, "Dual-wavelength low-coherence instantaneous phase-shifting interferometer to measure the shape of a segmented mirror with subnanometer precision," Appl. Opt. 47, 5473-5491 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-29-5473


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References

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