Method for the measurement of phase retardation of any wave plate with high precision
Applied Optics, Vol. 47, Issue 30, pp. 5562-5569 (2008)
http://dx.doi.org/10.1364/AO.47.005562
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Abstract
We present a measuring method for any wave plate retardation with fairly high precision that utilizes a laser frequency splitting technique. To avoid strong mode competition in measuring half and full wave plates, we use two separate methods: comparing adjacent longitudinal mode spacing, and phase offset with an additional quarter wave plate. Therefore any wave plate can be characterized by a single instrument, and no complicated experimental arrangement or data analysis is required. The performance of the system is demonstrated by determining the phase retardation of several samples to a precision and repeatability better than
© 2008 Optical Society of America
OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.1340) Lasers and laser optics : Atomic gas lasers
ToC Category:
Lasers and Laser Optics
History
Original Manuscript: May 13, 2008
Revised Manuscript: September 14, 2008
Manuscript Accepted: September 16, 2008
Published: October 13, 2008
Citation
Weixin Liu, Ming Liu, and Shulian Zhang, "Method for the measurement of phase retardation of any wave plate with high precision," Appl. Opt. 47, 5562-5569 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-30-5562
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