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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 30 — Oct. 20, 2008
  • pp: 5562–5569

Method for the measurement of phase retardation of any wave plate with high precision

Weixin Liu, Ming Liu, and Shulian Zhang  »View Author Affiliations

Applied Optics, Vol. 47, Issue 30, pp. 5562-5569 (2008)

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We present a measuring method for any wave plate retardation with fairly high precision that utilizes a laser frequency splitting technique. To avoid strong mode competition in measuring half and full wave plates, we use two separate methods: comparing adjacent longitudinal mode spacing, and phase offset with an additional quarter wave plate. Therefore any wave plate can be characterized by a single instrument, and no complicated experimental arrangement or data analysis is required. The performance of the system is demonstrated by determining the phase retardation of several samples to a precision and repeatability better than λ / 10 4 ; moreover, an error analysis is proposed.

© 2008 Optical Society of America

OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(140.0140) Lasers and laser optics : Lasers and laser optics
(140.1340) Lasers and laser optics : Atomic gas lasers

ToC Category:
Lasers and Laser Optics

Original Manuscript: May 13, 2008
Revised Manuscript: September 14, 2008
Manuscript Accepted: September 16, 2008
Published: October 13, 2008

Weixin Liu, Ming Liu, and Shulian Zhang, "Method for the measurement of phase retardation of any wave plate with high precision," Appl. Opt. 47, 5562-5569 (2008)

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