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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 32 — Nov. 10, 2008
  • pp: 6009–6013

Technique for the metrology calibration of a Fourier transform spectrometer

Locke D. Spencer and David A. Naylor  »View Author Affiliations

Applied Optics, Vol. 47, Issue 32, pp. 6009-6013 (2008)

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A method is presented for using a Fourier transform spectrometer (FTS) to calibrate the metrology of a second FTS. This technique is particularly useful when the second FTS is inside a cryostat or otherwise inaccessible.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 23, 2008
Revised Manuscript: October 9, 2008
Manuscript Accepted: October 10, 2008
Published: November 4, 2008

Locke D. Spencer and David A. Naylor, "Technique for the metrology calibration of a Fourier transform spectrometer," Appl. Opt. 47, 6009-6013 (2008)

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