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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 33 — Nov. 20, 2008
  • pp: 6226–6229

Approach for determining the refractive-index profile of graded-index planar waveguides

Renbo Song, Xiaodong Mu, Yujie J. Ding, Ashtosh Ganjoo, and Himanshu Jain  »View Author Affiliations

Applied Optics, Vol. 47, Issue 33, pp. 6226-6229 (2008)

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We measured the modal indices of a planar waveguide made from GeSeSb glass sandwiched between SiO 2 and air by using the prism-coupling technique. Based on the measured indices of the TE modes, we determined the position of the turning point corresponding to each mode of the waveguide by using the inverse WKB method. Using the modified fitting criterion introduced previously [Appl. Opt. 33, 3227 (1994)], we accurately determined the spatial profile of the refractive index for such a waveguide. Such a graded-index profile is probably caused by compositional variation of the GeSeSb guiding layer.

© 2008 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.6010) Integrated optics : Sensors
(230.7390) Optical devices : Waveguides, planar
(130.2755) Integrated optics : Glass waveguides

ToC Category:
Integrated Optics

Original Manuscript: August 5, 2008
Revised Manuscript: October 13, 2008
Manuscript Accepted: October 20, 2008
Published: November 18, 2008

Renbo Song, Xiaodong Mu, Yujie J. Ding, Ashtosh Ganjoo, and Himanshu Jain, "Approach for determining the refractive-index profile of graded-index planar waveguides," Appl. Opt. 47, 6226-6229 (2008)

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