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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 34 — Dec. 1, 2008
  • pp: 6334–6339

Nanodisplacement measurement using spectral shifts in a white-light interferometer

Maruthi M. Brundavanam, Nirmal K. Viswanathan, and D. Narayana Rao  »View Author Affiliations


Applied Optics, Vol. 47, Issue 34, pp. 6334-6339 (2008)
http://dx.doi.org/10.1364/AO.47.006334


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Abstract

We report a novel experimental method to measure nanometer displacements using wavelength shifts of spectral peaks around spectral switch or singular phase points in the interference spectra due to temporal correlation in a Michelson interferometer illuminated by a broadband white-light source. Dramatic changes in the spectral characteristics are recorded as a function of path difference between the interfering beams around the spectral switch position. These are then compared with measurements far from it in order to demonstrate the higher sensitivities involved in the proposed method.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(260.3160) Physical optics : Interference

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 15, 2008
Manuscript Accepted: October 10, 2008
Published: November 21, 2008

Citation
Maruthi M. Brundavanam, Nirmal K. Viswanathan, and D. Narayana Rao, "Nanodisplacement measurement using spectral shifts in a white-light interferometer," Appl. Opt. 47, 6334-6339 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-34-6334


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References

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