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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 35 — Dec. 10, 2008
  • pp: 6508–6511

Chromatic aberration measurement for transmission interferometric testing

Kibyung Seong and John E. Greivenkamp  »View Author Affiliations


Applied Optics, Vol. 47, Issue 35, pp. 6508-6511 (2008)
http://dx.doi.org/10.1364/AO.47.006508


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Abstract

A method of chromatic aberration measurement is described based on the transmitted wavefront of an optical element obtained from a Mach–Zehnder interferometer. The chromatic aberration is derived from transmitted wavefronts measured at five different wavelengths. Reverse ray tracing is used to remove induced aberrations associated with the interferometer from the measurement. In the interferometer, the wavefront transmitted through the sample is tested against a plano reference, allowing for the absolute determination of the wavefront radius of curvature. The chromatic aberrations of a singlet and a doublet have been measured.

© 2008 Optical Society of America

OCIS Codes
(220.4830) Optical design and fabrication : Systems design
(220.4840) Optical design and fabrication : Testing

ToC Category:
Optical Design and Fabrication

History
Original Manuscript: June 23, 2008
Revised Manuscript: October 8, 2008
Manuscript Accepted: October 16, 2008
Published: December 3, 2008

Citation
Kibyung Seong and John E. Greivenkamp, "Chromatic aberration measurement for transmission interferometric testing," Appl. Opt. 47, 6508-6511 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-35-6508


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References

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