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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 4 — Feb. 1, 2008
  • pp: 578–582

Measurement of optical and thermal properties of Hg1− x Cd x Te

Emily M. Heckman, Leonel P. Gonzalez, and Shekhar Guha  »View Author Affiliations


Applied Optics, Vol. 47, Issue 4, pp. 578-582 (2008)
http://dx.doi.org/10.1364/AO.47.000578


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Abstract

Measurements of optical transmission and several thermal properties of Hg 1 x Cd x Te alloys are reported for a few values of the alloy composition parameter x, which was determined by a microprobe technique. The values of the thermal diffusivity, specific heat, and thermal conductivity were measured using the laser-flash method. These results are reported at four discrete temperatures between 90 and 400   K and compared to those of three well-characterized semiconductor materials: Si, InAs, and InSb.

© 2008 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(160.6840) Materials : Thermo-optical materials

ToC Category:
Materials

History
Original Manuscript: August 16, 2007
Revised Manuscript: October 12, 2007
Manuscript Accepted: November 14, 2007
Published: January 25, 2008

Citation
Emily M. Heckman, Leonel P. Gonzalez, and Shekhar Guha, "Measurement of optical and thermal properties of Hg1−xCdxTe," Appl. Opt. 47, 578-582 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-4-578


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