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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 4 — Feb. 1, 2008
  • pp: A78–A87

Singular beam microscopy

Boris Spektor, Alexander Normatov, and Joseph Shamir  »View Author Affiliations


Applied Optics, Vol. 47, Issue 4, pp. A78-A87 (2008)
http://dx.doi.org/10.1364/AO.47.000A78


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Abstract

Optical singularities are localized regions in a light field where one or more of the field parameters, such as phase or polarization, become singular with associated zero intensity. Singular beam microscopy exploits the fact that the strong variations of the optical field around the singularities are highly sensitive to changes in their neighborhood. As a consequence, analysis of the light field scattered from the object during a scanning process can yield useful information about the object features. We present a theoretical background, numerical simulations, and experimental results. Preliminary experiments have demonstrated a sensitivity of 20 n m in the position and size of simple objects, with theoretically estimated 1 n m capability under the assumption of a reasonable and conservative 30 d B signal to noise ratio.

© 2008 Optical Society of America

OCIS Codes
(100.6740) Image processing : Synthetic discrimination functions
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(180.5810) Microscopy : Scanning microscopy

History
Original Manuscript: May 4, 2007
Revised Manuscript: October 19, 2007
Manuscript Accepted: October 20, 2007
Published: November 26, 2007

Virtual Issues
Vol. 3, Iss. 3 Virtual Journal for Biomedical Optics

Citation
Boris Spektor, Alexander Normatov, and Joseph Shamir, "Singular beam microscopy," Appl. Opt. 47, A78-A87 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-4-A78

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