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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 5 — Feb. 10, 2008
  • pp: 711–717

Generalized in-line digital holographic technique based on intensity measurements at two different planes

Guohai Situ, James P. Ryle, Unnikrishnan Gopinathan, and John T. Sheridan  »View Author Affiliations


Applied Optics, Vol. 47, Issue 5, pp. 711-717 (2008)
http://dx.doi.org/10.1364/AO.47.000711


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Abstract

In-line digital holography based on two-intensity measurements [Zhang et al. Opt. Lett. 29, 1787 (2004)], is modified by introducing a π shifting in the reference phase. Such an improvement avoids the assumption that the object beam must be much weaker than the reference beam in strength and results in a simplified experimental implementation. Computer simulations and optical experiments are carried out to validate the method, which we refer to as position-phase-shifting digital holography.

© 2008 Optical Society of America

OCIS Codes
(090.1760) Holography : Computer holography
(100.3010) Image processing : Image reconstruction techniques

ToC Category:
Holography

History
Original Manuscript: June 8, 2007
Revised Manuscript: October 15, 2007
Manuscript Accepted: December 14, 2007
Published: February 8, 2008

Citation
Guohai Situ, James P. Ryle, Unnikrishnan Gopinathan, and John T. Sheridan, "Generalized in-line digital holographic technique based on intensity measurements at two different planes," Appl. Opt. 47, 711-717 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-5-711


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