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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: James C. Wyant
  • Vol. 47, Iss. 7 — Mar. 1, 2008
  • pp: 894–900

Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

Julien Cardin and Dominique Leduc  »View Author Affiliations


Applied Optics, Vol. 47, Issue 7, pp. 894-900 (2008)
http://dx.doi.org/10.1364/AO.47.000894


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Abstract

We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.

© 2008 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(130.3130) Integrated optics : Integrated optics materials
(160.4760) Materials : Optical properties
(300.1030) Spectroscopy : Absorption

History
Original Manuscript: September 4, 2007
Revised Manuscript: December 17, 2007
Manuscript Accepted: January 3, 2008
Published: February 28, 2008

Citation
Julien Cardin and Dominique Leduc, "Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements," Appl. Opt. 47, 894-900 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-7-894

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