Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements
Applied Optics, Vol. 47, Issue 7, pp. 894-900 (2008)
http://dx.doi.org/10.1364/AO.47.000894
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Abstract
We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
© 2008 Optical Society of America
OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(130.3130) Integrated optics : Integrated optics materials
(160.4760) Materials : Optical properties
(300.1030) Spectroscopy : Absorption
History
Original Manuscript: September 4, 2007
Revised Manuscript: December 17, 2007
Manuscript Accepted: January 3, 2008
Published: February 28, 2008
Citation
Julien Cardin and Dominique Leduc, "Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements," Appl. Opt. 47, 894-900 (2008)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-47-7-894
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