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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 8 — Mar. 10, 2008
  • pp: 1103–1108

Reflection coefficients of p- and s-polarized light by a quarter-wave layer: explicit expressions and application to beam splitters

R. M. A. Azzam and F. F. Sudradjat  »View Author Affiliations

Applied Optics, Vol. 47, Issue 8, pp. 1103-1108 (2008)

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The complex-amplitude reflection coefficients of p- and s-polarized light by a transparent freestanding, embedded, or deposited quarter-wave layer (QWL) are derived as explicit functions of the angle of incidence and layer refractive index. This provides the basis for the design of 50%–50% beam splitters for incident s-polarized or unpolarized light that use a high-index (e.g., Ti O 2 or Ge) QWL embedded in a glass cube in the visible and near infrared spectral range. These simple devices have good angular and spectral response and are insensitive to small film thickness errors to the first order.

© 2008 Optical Society of America

OCIS Codes
(230.1360) Optical devices : Beam splitters
(260.5430) Physical optics : Polarization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

Original Manuscript: October 31, 2007
Manuscript Accepted: December 13, 2007
Published: March 7, 2008

R. M. A. Azzam and F. F. Sudradjat, "Reflection coefficients of p- and s-polarized light by a quarter-wave layer: explicit expressions and application to beam splitters," Appl. Opt. 47, 1103-1108 (2008)

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