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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 8 — Mar. 10, 2008
  • pp: 1164–1170

Effect of laser irradiation on silica substrate contaminated by aluminum particles

Stéphanie Palmier, Jean Luc Rullier, Jérémie Capoulade, and Jean Yves Natoli  »View Author Affiliations

Applied Optics, Vol. 47, Issue 8, pp. 1164-1170 (2008)

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A major issue in the use of high-power lasers, such as the Laser Megajoule (LMJ), is laser-induced damage of optical components. One potential damage initiator is particulate contamination, but its effect is hard to distinguish from that of other damage precursors. To do so, we introduced artificial contaminants typical of metallic pollution likely to be present on the optical components of the LMJ chains. More precisely, aluminum particles of two different sizes were placed on a silica sample. These dots were characterized by optical microscopy and profilometry. Then they were exposed to a laser beam with a pulse length of 6.5 ns at 1064 nm and fluences in the range from 1 to 40 J / cm 2 . Each dot was characterized again with the same techniques and also by photothermal microscopy. To complete the experimental results, we performed numerical simulations with a one-dimensional Lagrangian hydrodynamics code. We show that the particle removal by laser irradiation produces a modification of the silica surface that does not evolve into catastrophic damage under subsequent irradiation. However, the effect does depend on the size of the dots. We demonstrate that a procedure exists that removes the dot and leaves the site capable of resisting high fluence.

© 2008 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(160.3900) Materials : Metals
(160.6030) Materials : Silica

ToC Category:

Original Manuscript: October 10, 2007
Revised Manuscript: January 24, 2008
Manuscript Accepted: January 25, 2008
Published: March 10, 2008

Stéphanie Palmier, Jean Luc Rullier, Jérémie Capoulade, and Jean Yves Natoli, "Effect of laser irradiation on silica substrate contaminated by aluminum particles," Appl. Opt. 47, 1164-1170 (2008)

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