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Applied Optics

Applied Optics


  • Editor: James C. Wyant
  • Vol. 47, Iss. 9 — Mar. 20, 2008
  • pp: 1310–1316

Hilbert transform analysis of a time series of speckle interferograms with a temporal carrier

Fernando A. Marengo Rodriguez, Alejandro Federico, and Guillermo H. Kaufmann  »View Author Affiliations

Applied Optics, Vol. 47, Issue 9, pp. 1310-1316 (2008)

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We present an optical phase measurement method based on the Hilbert transform for the analysis of a time series of speckle interferograms modulated by a temporal carrier. We discuss the influence of nonmodulating pixels, modulation loss, and noise that affect the bias and modulation intensities of the interferometric signal and propose the application of the empirical mode decomposition method for its minimization. We also show the equivalence between the phase recovery approaches that are based on the Hilbert and the Fourier transforms. Finally, we present a numerical comparison between these methods using computer-simulated speckle interferograms modulated with a temporal carrier.

© 2008 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 8, 2007
Manuscript Accepted: January 3, 2008
Published: March 18, 2008

Fernando A. Marengo Rodriguez, Alejandro Federico, and Guillermo H. Kaufmann, "Hilbert transform analysis of a time series of speckle interferograms with a temporal carrier," Appl. Opt. 47, 1310-1316 (2008)

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