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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 1 — Jan. 1, 2009
  • pp: 11–16

Aberration-corrected Czerny–Turner imaging spectrometer with a wide spectral region

Qingsheng Xue, Shurong Wang, and Fengqin Lu  »View Author Affiliations

Applied Optics, Vol. 48, Issue 1, pp. 11-16 (2009)

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A modified asymmetrical Czerny–Turner arrangement with a fixed plane grating is proposed to correct aberrations over a wide spectral region by analysis of the dependence of aberration correction for different wavelengths. The principle and method of aberration correction are described in detail. We compare the performance of this modified Czerny–Turner arrangement with that of the existing Czerny–Turner arrangement by using a practical Czerny–Turner imaging spectrometer example.

© 2008 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(300.0300) Spectroscopy : Spectroscopy
(300.6190) Spectroscopy : Spectrometers

ToC Category:

Original Manuscript: September 19, 2008
Revised Manuscript: November 3, 2008
Manuscript Accepted: November 11, 2008
Published: December 15, 2008

Qingsheng Xue, Shurong Wang, and Fengqin Lu, "Aberration-corrected Czerny-Turner imaging spectrometer with a wide spectral region," Appl. Opt. 48, 11-16 (2009)

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