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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 11 — Apr. 10, 2009
  • pp: 2037–2044

Terahertz birefringence for orientation analysis

Christian Jördens, Maik Scheller, Matthias Wichmann, Martin Mikulics, Karin Wiesauer, and Martin Koch  »View Author Affiliations

Applied Optics, Vol. 48, Issue 11, pp. 2037-2044 (2009)

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A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the largest birefringence for a rutile crystal with Δ n = 3.3 at 1 THz .

© 2009 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(230.5440) Optical devices : Polarization-selective devices
(260.1440) Physical optics : Birefringence

ToC Category:

Original Manuscript: December 1, 2008
Revised Manuscript: March 8, 2009
Manuscript Accepted: March 13, 2009
Published: April 1, 2009

Christian Jördens, Maik Scheller, Matthias Wichmann, Martin Mikulics, Karin Wiesauer, and Martin Koch, "Terahertz birefringence for orientation analysis," Appl. Opt. 48, 2037-2044 (2009)

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