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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 12 — Apr. 20, 2009
  • pp: 2236–2242

Sagnac-interferometer-based characterization of spatial light modulators

Jian Wei Tay, Michael A. Taylor, and Warwick P. Bowen  »View Author Affiliations

Applied Optics, Vol. 48, Issue 12, pp. 2236-2242 (2009)

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A method for characterizing the phase response of spatial light modulators (SLMs) by using a Sagnac interferometer is proposed and demonstrated. The method represents an improvement over conventional diffraction-based or interferometric techniques by providing a simple and accurate phase measurement while taking advantage of the inherent phase stability of a Sagnac interferometer. As a demonstration, the phase response of a commercial liquid crystal on a silicon SLM is characterized and then linearized by using a programmable lookup table. The transverse phase profile over the SLM surface is also measured.

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.3720) Optical devices : Liquid-crystal devices
(230.6120) Optical devices : Spatial light modulators

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 1, 2008
Revised Manuscript: February 18, 2009
Manuscript Accepted: March 26, 2009
Published: April 14, 2009

Jian Wei Tay, Michael A. Taylor, and Warwick P. Bowen, "Sagnac-interferometer-based characterization of spatial light modulators," Appl. Opt. 48, 2236-2242 (2009)

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