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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 13 — May. 1, 2009
  • pp: 2410–2420

Superimposed fringe projection for three-dimensional shape acquisition by image analysis

Marco Sasso, Gianluca Chiappini, Giacomo Palmieri, and Dario Amodio  »View Author Affiliations


Applied Optics, Vol. 48, Issue 13, pp. 2410-2420 (2009)
http://dx.doi.org/10.1364/AO.48.002410


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Abstract

The aim in this work is the development of an image analysis technique for 3D shape acquisition, based on luminous fringe projections. In more detail, the method is based on the simultaneous use of several projectors, which is desirable whenever the surface under inspection has a complex geometry, with undercuts or shadow areas. In these cases, the usual fringe projection technique needs to perform several acquisitions, each time moving the projector or using several projectors alternately. Besides the procedure of fringe projection and phase calculation, an unwrap algorithm has been developed in order to obtain continuous phase maps needed in following calculations for shape extraction. With the technique of simultaneous projections, oriented in such a way to cover all of the surface, it is possible to increase the speed of the acquisition process and avoid the postprocessing problems related to the matching of different point clouds.

© 2009 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(100.5088) Image processing : Phase unwrapping

ToC Category:
Image Processing

History
Original Manuscript: December 8, 2008
Revised Manuscript: February 12, 2009
Manuscript Accepted: March 3, 2009
Published: April 22, 2009

Citation
Marco Sasso, Gianluca Chiappini, Giacomo Palmieri, and Dario Amodio, "Superimposed fringe projection for three-dimensional shape acquisition by image analysis," Appl. Opt. 48, 2410-2420 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-13-2410

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