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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 13 — May. 1, 2009
  • pp: 2461–2467

Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index

Jihoon Na, Hae Young Choi, Eun Seo Choi, ChangSu Lee, and Byeong Ha Lee  »View Author Affiliations

Applied Optics, Vol. 48, Issue 13, pp. 2461-2467 (2009)

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We present a method for simultaneously measuring the thickness and the group refractive index of a specimen using self-referenced spectral-domain fiber-based interferometry. By removing the scanning part and using the fiber-based configuration, the system complexity and stability could be significantly improved. To minimize the system drift, we utilized the signals originated from the fiber ends of both arms. Implementing in a self-referenced configuration, we could improve the measurement accuracy down to a decimal place. Experimental measurements were made with a 1.555 mm thick fused silica plate. At 814 nm the thickness was measured as 1.5546 ± 0.0002 mm , and at the same time, the group index was obtained as 1.4627 ± 0.0002 .

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(170.4500) Medical optics and biotechnology : Optical coherence tomography

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 21, 2009
Revised Manuscript: March 23, 2009
Manuscript Accepted: April 13, 2009
Published: April 23, 2009

Virtual Issues
Vol. 4, Iss. 7 Virtual Journal for Biomedical Optics

Jihoon Na, Hae Young Choi, Eun Seo Choi, ChangSu Lee, and Byeong Ha Lee, "Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index," Appl. Opt. 48, 2461-2467 (2009)

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