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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 13 — May. 1, 2009
  • pp: 2491–2495

Spectral interferometric measurement of wavelength-dependent phase response for surface plasmon resonance sensors

Zheng Zheng, Yuhang Wan, Xin Zhao, and Jinsong Zhu  »View Author Affiliations

Applied Optics, Vol. 48, Issue 13, pp. 2491-2495 (2009)

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Here we experimentally demonstrate measurements of the wavelength-dependent phase response of a surface plasmon resonance sensor using a spectral interferometric technique. By using a broadband incoherent fiber light source and a polarimetry configuration with a high-birefringence component, the spectral phase response of a surface plasmon resonance sensor can be retrieved. A combination of wavelength interrogation and phase detection is enabled by our proposed scheme. In contrast to the previously demonstrated heterodyne or spatial fringe detection schemes, this in-line optical configuration is much simpler and can be very compact when implemented with advanced fiber optic and integrated components.

© 2009 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6680) Optics at surfaces : Surface plasmons
(280.4788) Remote sensing and sensors : Optical sensing and sensors

ToC Category:
Optics at Surfaces

Original Manuscript: February 9, 2009
Revised Manuscript: March 31, 2009
Manuscript Accepted: April 3, 2009
Published: April 24, 2009

Zheng Zheng, Yuhang Wan, Xin Zhao, and Jinsong Zhu, "Spectral interferometric measurement of wavelength-dependent phase response for surface plasmon resonance sensors," Appl. Opt. 48, 2491-2495 (2009)

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