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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 14 — May. 10, 2009
  • pp: 2760–2766

Exact wavefront recovery with tilt from lateral shear interferograms

Zi-qiang Yin  »View Author Affiliations

Applied Optics, Vol. 48, Issue 14, pp. 2760-2766 (2009)

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A novel method is presented for one-dimensional wavefront recovery on the basis of difference measurements from two shearing interferograms with varying tilt. The method uses large shears and obtains high lateral resolution. Furthermore, the wavefront under test can be recovered exactly up to an arbitrary constant and straight line at all evaluation points with suitably chosen shears of two shearing interferograms.

© 2009 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 2, 2008
Revised Manuscript: February 5, 2009
Manuscript Accepted: April 21, 2009
Published: May 7, 2009

Zi-qiang Yin, "Exact wavefront recovery with tilt from lateral shear interferograms," Appl. Opt. 48, 2760-2766 (2009)

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