Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Comparison measurements of 0 45 radiance factor and goniometrically determined diffuse reflectance

Not Accessible

Your library or personal account may give you access

Abstract

A comparison between the absolute gonioreflectometric scales at the Helsinki University of Technology (TKK) and the Physikalisch-Technische Bundesanstalt (PTB) has been accomplished. Six different reflection standards were measured for their 045 spectral radiance factor between 250 and 1650nm in 10nm intervals. Also, the 0d reflectance factor between 400 and 1600nm in 100nm intervals was determined from goniometric reflectance measurements over polar angles with subsequent integration within the hemisphere above the sample. Goniometric comparisons covering such an extensive wavelength range and also several different sample materials are rarely implemented. For all but one sample, the difference between the results obtained at the TKK and the PTB was, with the exception of a couple of measurement points, within the expanded uncertainty (k=2) of the comparison at least up to a wavelength of 1400nm. All differences between the measurement results can be understood, except for one translucent sample in the visible wavelength range. The effect of sample translucency was found to be significant in the NIR wavelength region. Also, a general tendency of an increase of the TKK values relative to the PTB values in the UV region was observed. Possible causes for this phenomenon are discussed.

© 2009 Optical Society of America

Full Article  |  PDF Article
More Like This
Bidirectional reflectance scale comparison between NIST and PTB

Catherine C. Cooksey, Maria E. Nadal, David W. Allen, Kai-Olaf Hauer, and Andreas Höpe
Appl. Opt. 54(13) 4006-4015 (2015)

Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared

Catherine C. Cooksey, David W. Allen, Benjamin K. Tsai, and Howard W. Yoon
Appl. Opt. 54(10) 3064-3071 (2015)

Gonioreflectometer for measuring spectral diffuse reflectance

Saulius Nevas, Farshid Manoocheri, and Erkki Ikonen
Appl. Opt. 43(35) 6391-6399 (2004)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (12)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (4)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved