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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 15 — May. 20, 2009
  • pp: 2946–2956

Comparison measurements of 0 45 radiance factor and goniometrically determined diffuse reflectance

Silja Holopainen, Farshid Manoocheri, Erkki Ikonen, Kai-Olaf Hauer, and Andreas Höpe  »View Author Affiliations

Applied Optics, Vol. 48, Issue 15, pp. 2946-2956 (2009)

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A comparison between the absolute gonioreflectometric scales at the Helsinki University of Technology (TKK) and the Physikalisch-Technische Bundesanstalt (PTB) has been accomplished. Six different reflection standards were measured for their 0 45 spectral radiance factor between 250 and 1650 nm in 10 nm intervals. Also, the 0 d reflectance factor between 400 and 1600 nm in 100 nm intervals was determined from goniometric reflectance measurements over polar angles with subsequent integration within the hemisphere above the sample. Goniometric comparisons covering such an extensive wavelength range and also several different sample materials are rarely implemented. For all but one sample, the difference between the results obtained at the TKK and the PTB was, with the exception of a couple of measurement points, within the expanded uncertainty ( k = 2 ) of the comparison at least up to a wavelength of 1400 nm . All differences between the measurement results can be understood, except for one translucent sample in the visible wavelength range. The effect of sample translucency was found to be significant in the NIR wavelength region. Also, a general tendency of an increase of the TKK values relative to the PTB values in the UV region was observed. Possible causes for this phenomenon are discussed.

© 2009 Optical Society of America

OCIS Codes
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 11, 2008
Revised Manuscript: March 11, 2009
Manuscript Accepted: April 8, 2009
Published: May 18, 2009

Silja Holopainen, Farshid Manoocheri, Erkki Ikonen, Kai-Olaf Hauer, and Andreas Höpe, "Comparison measurements of 0∶45 radiance factor and goniometrically determined diffuse reflectance," Appl. Opt. 48, 2946-2956 (2009)

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