OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 15 — May. 20, 2009
  • pp: 2946–2956

Comparison measurements of 0 45 radiance factor and goniometrically determined diffuse reflectance

Silja Holopainen, Farshid Manoocheri, Erkki Ikonen, Kai-Olaf Hauer, and Andreas Höpe  »View Author Affiliations


Applied Optics, Vol. 48, Issue 15, pp. 2946-2956 (2009)
http://dx.doi.org/10.1364/AO.48.002946


View Full Text Article

Enhanced HTML    Acrobat PDF (1577 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A comparison between the absolute gonioreflectometric scales at the Helsinki University of Technology (TKK) and the Physikalisch-Technische Bundesanstalt (PTB) has been accomplished. Six different reflection standards were measured for their 0 45 spectral radiance factor between 250 and 1650 nm in 10 nm intervals. Also, the 0 d reflectance factor between 400 and 1600 nm in 100 nm intervals was determined from goniometric reflectance measurements over polar angles with subsequent integration within the hemisphere above the sample. Goniometric comparisons covering such an extensive wavelength range and also several different sample materials are rarely implemented. For all but one sample, the difference between the results obtained at the TKK and the PTB was, with the exception of a couple of measurement points, within the expanded uncertainty ( k = 2 ) of the comparison at least up to a wavelength of 1400 nm . All differences between the measurement results can be understood, except for one translucent sample in the visible wavelength range. The effect of sample translucency was found to be significant in the NIR wavelength region. Also, a general tendency of an increase of the TKK values relative to the PTB values in the UV region was observed. Possible causes for this phenomenon are discussed.

© 2009 Optical Society of America

OCIS Codes
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 11, 2008
Revised Manuscript: March 11, 2009
Manuscript Accepted: April 8, 2009
Published: May 18, 2009

Citation
Silja Holopainen, Farshid Manoocheri, Erkki Ikonen, Kai-Olaf Hauer, and Andreas Höpe, "Comparison measurements of 0∶45 radiance factor and goniometrically determined diffuse reflectance," Appl. Opt. 48, 2946-2956 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-15-2946


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. W. Erb, “Requirements for reflection standards and the measurement of their reflection values,” Appl. Opt. 14, 493-499 (1975). [CrossRef] [PubMed]
  2. H. Shitomi, Y. Mishima, and I. Saito, “Development of a new integrating sphere with uniform reflectance for absolute diffuse reflectance measurements,” Metrologia 40, S185-S188 (2003). [CrossRef]
  3. C. J. Chunnilall, A. J. Deadman, L. Crane, and E. Usadi, “NPL scales for radiance factor and total diffuse reflectance,” Metrologia 40, S192-S195 (2003). [CrossRef]
  4. S. Nevas, F. Manoocheri, and E. Ikonen, “Gonioreflectometer for measuring spectral diffuse reflectance,” Appl. Opt. 43, 6391-6399 (2004). [CrossRef] [PubMed]
  5. D. Hünerhoff, U. Grusemann, and A. Höpe, “New robot based gonioreflectometer for measuring spectral diffuse reflection,” Metrologia 43, S11-S16 (2006). [CrossRef]
  6. “Absolute Methods for Reflection Measurement,” 1st ed. (Commission Internationale de l'Eclairage,1979), Vol. 44.
  7. W. Budde, W. Erb, and J. J. Hsia, “International intercomparison of absolute reflectance scales,” Color Res. Appl. 7, 24-27 (1982). [CrossRef]
  8. J. C. Zwinkels and W. Erb, “Comparison of absolute d/0 diffuse reflectance factor scales of the NRC and the PTB,” Metrologia 34, 357-363 (1997). [CrossRef]
  9. S. Nevas, S. Holopainen, F. Manoocheri, E. Ikonen, Y. Liu, T. H. Lang, and G. Xu, “Comparison measurements of spectral diffuse reflectance,” in Proceedings of the 9th International Conference on New Developments and Applications in Optical Radiometry (Physikalisch-Meteorologisches Observatorium, 2005), pp. 239-240.
  10. V. E. Kartachevskaya, H. Korte, and A. R. Robertson, “International comparison of measurements of luminance factor and reflectance of white diffusing samples,” Appl. Opt. 14, 2694-2702 (1975). [CrossRef] [PubMed]
  11. C. Chunnilall, E. A. Early, and A. Höpe, “NIST-NPL-PTB comparison of radiance factor,” poster at the 8th International Conference on New Developments and Applications in Optical Radiometry, Gaithersburg, Maryland, USA, 20-24. May 2002.
  12. A. Höpe and D. Hünerhoff, “Robot-based gonioreflectometry at PTB,” in Proceedings of the 5th Oxford Conference on Spectrometry, (National Physical Laboratory, date?), pp. 65-69(2006).
  13. A. Höpe, D. Hünerhoff, and K.-O. Hauer, “Robot-based gonioreflectometer,” Industrial Robotics: Programming, Simulation and Applications, L. Kin-Huat, ed. (iIV Pro Literatur-Verlag, 2007), pp. 623-632.
  14. S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007). [CrossRef]
  15. Guide to the Expression of Uncertainty in Measurement (ISO, 1992).
  16. J. C. Zwinkels and F. Gauthier, “Investigation of photoluminescent effect in opal glasses used as diffuse reflectance standards,” Proc. SPIE 4826, 70-78 (2003). [CrossRef]
  17. “The certification of Opal Glass,” Tech. rep. 406 (Commission of the European Communities, 1990).
  18. S. Holopainen, F. Manoocheri, and E. Ikonen, “Goniofluorometer for characterization of fluorescent materials,” Appl. Opt. 47, 835-842 (2008). [CrossRef] [PubMed]
  19. F. J. J. Clarke, F. A. Garforth and D. J. Barry, “Goniophotometric and polarization properties of white reflection standard materials,” Light. Res. Technol. 15, 133-149 (1983). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited