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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 16 — Jun. 1, 2009
  • pp: 3030–3034

Determining the values of second-order surface nonlinearities by measurements with wave plates of different retardations

Ventsislav K. Valev, Stijn Foerier, and Thierry Verbiest  »View Author Affiliations


Applied Optics, Vol. 48, Issue 16, pp. 3030-3034 (2009)
http://dx.doi.org/10.1364/AO.48.003030


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Abstract

We measured the second harmonic generation response of a thin film consisting of chiral molecules with four wave plates having different retardation coefficients. By means of the fitting procedure described in a previously reported formalism, we demonstrated that a single set of tensor components of second order surface nonlinearities fits all the data. Our results provide clear experimental evidence for the validity of this method, which can find applications in the studies of chiral structures and achiral anisotropic materials.

© 2009 Optical Society of America

OCIS Codes
(190.4160) Nonlinear optics : Multiharmonic generation
(160.1585) Materials : Chiral media

ToC Category:
Nonlinear Optics

History
Original Manuscript: March 13, 2009
Manuscript Accepted: May 1, 2009
Published: June 1, 2009

Citation
Ventsislav K. Valev, Stijn Foerier, and Thierry Verbiest, "Determining the values of second-order surface nonlinearities by measurements with wave plates of different retardations," Appl. Opt. 48, 3030-3034 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-16-3030

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