Determining the values of second-order surface nonlinearities by measurements with wave plates of different retardations
Applied Optics, Vol. 48, Issue 16, pp. 3030-3034 (2009)
http://dx.doi.org/10.1364/AO.48.003030
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Abstract
We measured the second harmonic generation response of a thin film consisting of chiral molecules with four wave plates having different retardation coefficients. By means of the fitting procedure described in a previously reported formalism, we demonstrated that a single set of tensor components of second order surface nonlinearities fits all the data. Our results provide clear experimental evidence for the validity of this method, which can find applications in the studies of chiral structures and achiral anisotropic materials.
© 2009 Optical Society of America
OCIS Codes
(190.4160) Nonlinear optics : Multiharmonic generation
(160.1585) Materials : Chiral media
ToC Category:
Nonlinear Optics
History
Original Manuscript: March 13, 2009
Manuscript Accepted: May 1, 2009
Published: June 1, 2009
Citation
Ventsislav K. Valev, Stijn Foerier, and Thierry Verbiest, "Determining the values of second-order surface nonlinearities by measurements with wave plates of different retardations," Appl. Opt. 48, 3030-3034 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-16-3030
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