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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 16 — Jun. 1, 2009
  • pp: 3070–3074

Improving the reconstruction quality with extension and apodization of the digital hologram

Yancao Zhang, Jianlin Zhao, Qi Fan, Wei Zhang, and Sheng Yang  »View Author Affiliations


Applied Optics, Vol. 48, Issue 16, pp. 3070-3074 (2009)
http://dx.doi.org/10.1364/AO.48.003070


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Abstract

To suppress the aperture diffraction and spectral leakage effects in the reconstruction process of the digital hologram and to maintain the original information recorded in the hologram, a novel reconstruction method based on extension and apodization of the digital hologram is presented, by which the original hologram can be extended by filling the average intensity values of the boundary, and the extended hologram is apodized by use of the constructed window function. As a sample, the digital hologram of the static particle field is recorded and numerically extended and then apodized with the appointed window. Finally, an unabridged and clear digital holographic image is reconstructed from the extended and apodized hologram. The experimental results confirm that this method cannot only eliminate the black-and-white diffraction fringes in the reconstructed image, but also attain the unabridged image with high quality.

© 2009 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(050.1940) Diffraction and gratings : Diffraction
(100.0100) Image processing : Image processing
(110.1220) Imaging systems : Apertures
(220.1230) Optical design and fabrication : Apodization
(090.1995) Holography : Digital holography

ToC Category:
Holography

History
Original Manuscript: February 10, 2009
Revised Manuscript: May 5, 2009
Manuscript Accepted: May 5, 2009
Published: May 22, 2009

Citation
Yancao Zhang, Jianlin Zhao, Qi Fan, Wei Zhang, and Sheng Yang, "Improving the reconstruction quality with extension and apodization of the digital hologram," Appl. Opt. 48, 3070-3074 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-16-3070

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