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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 21 — Jul. 20, 2009
  • pp: 4124–4129

Linear optical characterization of transparent thin films by the Z-scan technique

Georges Boudebs and Kamil Fedus  »View Author Affiliations


Applied Optics, Vol. 48, Issue 21, pp. 4124-4129 (2009)
http://dx.doi.org/10.1364/AO.48.004124


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Abstract

We report experimental characterization of a very small rectangular phase shift ( < 0.3 rad ) obtained from the far-field diffraction patterns using a closed aperture Z-scan technique. The numerical simulations as well as the experimental results reveal a peak–valley configuration in the far-field normalized transmittance, allowing us to determine the sign of the dephasing. The conditions necessary to obtain useful Z-scan traces are discussed. We provide simple linear expressions relating the measured signal to the phase shift. A very good agreement between calculated and experimental Z-scan profiles validates our approach. We show that a very well known nonlinear characterization technique can be extended for linear optical parameter estimation (as refractive index or thickness).

© 2009 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(050.5080) Diffraction and gratings : Phase shift
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(310.6860) Thin films : Thin films, optical properties
(070.7345) Fourier optics and signal processing : Wave propagation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 18, 2009
Revised Manuscript: June 26, 2009
Manuscript Accepted: June 29, 2009
Published: July 13, 2009

Citation
Georges Boudebs and Kamil Fedus, "Linear optical characterization of transparent thin films by the Z-scan technique," Appl. Opt. 48, 4124-4129 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-21-4124


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References

  1. W. H. Steel, Interferometry, 2nd ed. (Cambridge University, 1983).
  2. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. Hagan, and E. W. Stryland, “Sensitive measurements of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760-769 (1990). [CrossRef]
  3. B. M. Patterson, W. R. White, T. A. Robbins, and R. J. Knize, “Linear optical effects in Z-scan measurements of thin films,” Appl. Opt. 37, 1854-1857 (1998). [CrossRef]
  4. K. Fedus, G. Boudebs, C. B. de Araujo, M. Cathelinaud, F. Charpentier, and V. Nazabal, “Photo-induced effects in thin films of Te20As30Se50 glass with nonlinear characterization,” Appl. Phys. Lett. 94, 061122 (2009). [CrossRef]
  5. J. Cardin and D. Leduc, “Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements,” Appl. Opt. 47, 894-900 (2008). [CrossRef] [PubMed]
  6. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (Elsevier, 1987).
  7. A.-H. Liu, P. C. Wayner, Jr., and J. L. Plawsky, “Image scanning ellipsometry for measuring nonuniform film thickness profiles,” Appl. Opt. 33, 1223-1229 (1994). [CrossRef] [PubMed]
  8. G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67,2930-2936 (1996). [CrossRef]
  9. A. Albersdorfer, G. Elender, G. Mathe, K. R. Neumaier, P. Paduschek, and E. Sackmann, “High resolution imaging microellipsometry of soft surfaces at 3 μm lateral and 5 A normal resolution,” Appl. Phys. Lett. 72, 2930-2932 (1998). [CrossRef]
  10. S. Otsuki, K. Tamada, and S. Wakida, “Two-dimensional thickness measurements based on internal reflection ellipsometry,” Appl. Opt. 44, 1410-1415 (2005). [CrossRef] [PubMed]
  11. C. Wang, J. Lin, H. Jian, and C. Lee, “Transparent thin-film characterization by using differential optical sectioning interference microscopy,” Appl. Opt. 46, 7460-7463 (2007). [CrossRef] [PubMed]
  12. J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, 1996).
  13. G. Boudebs, K. Fedus, C. Cassagne, and H. Leblond, “Degenerate multiwave mixing using Z-scan technique,” Appl. Phys. Lett. 93, 021118 (2008). [CrossRef]
  14. G. Boudebs, M. Chis, and J. P. Bourdin, “Third-order susceptibility measurements by nonlinear image processing,” J. Opt. Soc. Am. B. 13, 1450-1456 (1996). [CrossRef]
  15. H. M. Zidan and M. Abu-Elnader, “Structural and optical properties of pure PMMA and metal chloride-doped PMMA films,” Physica B 355, 308-317 (2005). [CrossRef]

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