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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 21 — Jul. 20, 2009
  • pp: 4124–4129

Linear optical characterization of transparent thin films by the Z-scan technique

Georges Boudebs and Kamil Fedus  »View Author Affiliations

Applied Optics, Vol. 48, Issue 21, pp. 4124-4129 (2009)

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We report experimental characterization of a very small rectangular phase shift ( < 0.3 rad ) obtained from the far-field diffraction patterns using a closed aperture Z-scan technique. The numerical simulations as well as the experimental results reveal a peak–valley configuration in the far-field normalized transmittance, allowing us to determine the sign of the dephasing. The conditions necessary to obtain useful Z-scan traces are discussed. We provide simple linear expressions relating the measured signal to the phase shift. A very good agreement between calculated and experimental Z-scan profiles validates our approach. We show that a very well known nonlinear characterization technique can be extended for linear optical parameter estimation (as refractive index or thickness).

© 2009 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(050.5080) Diffraction and gratings : Phase shift
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(310.6860) Thin films : Thin films, optical properties
(070.7345) Fourier optics and signal processing : Wave propagation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 18, 2009
Revised Manuscript: June 26, 2009
Manuscript Accepted: June 29, 2009
Published: July 13, 2009

Georges Boudebs and Kamil Fedus, "Linear optical characterization of transparent thin films by the Z-scan technique," Appl. Opt. 48, 4124-4129 (2009)

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