OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 22 — Aug. 1, 2009
  • pp: 4285–4290

Highly accurate Michelson type wavelength meter that uses a rubidium stabilized 1560 nm diode laser as a wavelength reference

Shin Masuda, Eiji Kanoh, Akiyoshi Irisawa, and Shoji Niki  »View Author Affiliations


Applied Optics, Vol. 48, Issue 22, pp. 4285-4290 (2009)
http://dx.doi.org/10.1364/AO.48.004285


View Full Text Article

Enhanced HTML    Acrobat PDF (567 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We investigated the accuracy limitation of a wavelength meter installed in a vacuum chamber to enable us to develop a highly accurate meter based on a Michelson interferometer in 1550 nm optical communication bands. We found that an error of parts per million order could not be avoided using famous wavelength compensation equations. Chromatic dispersion of the refractive index in air can almost be disregarded when a 1560 nm wavelength produced by a rubidium (Rb) stabilized distributed feedback (DFB) diode laser is used as a reference wavelength. We describe a novel dual-wavelength self-calibration scheme that maintains high accuracy of the wavelength meter. The method uses the fundamental and second-harmonic wavelengths of an Rb-stabilized DFB diode laser. Consequently, a highly accurate Michelson type wavelength meter with an absolute accuracy of 5 × 10 8 ( 10 MHz , 0.08 pm ) over a wide wavelength range including optical communication bands was achieved without the need for a vacuum chamber.

© 2009 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 2, 2009
Revised Manuscript: July 6, 2009
Manuscript Accepted: July 8, 2009
Published: July 21, 2009

Citation
Shin Masuda, Eiji Kanoh, Akiyoshi Irisawa, and Shoji Niki, "Highly accurate Michelson type wavelength meter that uses a rubidium stabilized 1560 nm diode laser as a wavelength reference," Appl. Opt. 48, 4285-4290 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-22-4285


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. Y. Akimoto, L. Yong-chol, S. Hatano, A. Irisawa, and S. Niki, “Practical absolute wavelength meter using iodine-stabilized diode laser,” Proc. SPIE 4932, 615-623 (2003). [CrossRef]
  2. http://www.toptica.com.
  3. Th. Udem, J. Reichert, R. Holzwarth, and T. W. Hänsch, “Absolute optical frequency measurement of the cesium D1 line with a mode-locked laser,” Phys. Rev. Lett. 82, 3568-3571 (1999). [CrossRef]
  4. A. Onae, T. Ikegami, K. Sugiyama, F.-L. Hong, K. Minoshima, H. Matsumoto, K. Nakagawa, M. Yoshida, and S. Harada, “Optical frequency link between an acetylene stabilized laser at 1542 nm and an Rb stabilized laser at 778 nm using a two-color mode-locked fiber laser,” Opt. Commun. 183, 181-187 (2000). [CrossRef]
  5. F.-L. Hong, A. Onae, J. Jiang, R. Guo, H. Inaba, K. Minoshima, T. R. Schibli, H. Matsumoto, and K. Nakagawa, “Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm,” Opt. Lett. 28, 2324-2326 (2003). [CrossRef] [PubMed]
  6. A. Czajkowski, A. A. Madej, and P. Dubé, “Development and study of a 1.5 μm optical frequency standard referenced to the P(16) saturated absorption line in the (ν1+ν3) overtone band of 13C2H2,” Opt. Commun. 234, 259-268 (2004). [CrossRef]
  7. P. Balling, “Absolute frequency measurement of wavelength standard at 1542: acetylene stabilized DFB laser,” Opt. Express 13, 9196-9201 (2005). [CrossRef] [PubMed]
  8. B. Edlén, “The refractive index of air,” Metrologia 2, 71-80 (1966). [CrossRef]
  9. J. Ye, S. Swartz, P. Jungner, and J. L. Hall, “Hyperfine structure and absolute frequency of the 87Rb5P3/2 state,” Opt. Lett. 21, 1280-1282 (1996). [CrossRef] [PubMed]
  10. S. Masuda, A. Seki, and S. Niki, “Optical frequency standard by using a 1560 nm diode laser locked to saturated absorption lines of rubidium vapor,” Appl. Opt. 46, 4780-4785 (2007). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited