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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 22 — Aug. 1, 2009
  • pp: 4285–4290

Highly accurate Michelson type wavelength meter that uses a rubidium stabilized 1560 nm diode laser as a wavelength reference

Shin Masuda, Eiji Kanoh, Akiyoshi Irisawa, and Shoji Niki  »View Author Affiliations

Applied Optics, Vol. 48, Issue 22, pp. 4285-4290 (2009)

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We investigated the accuracy limitation of a wavelength meter installed in a vacuum chamber to enable us to develop a highly accurate meter based on a Michelson interferometer in 1550 nm optical communication bands. We found that an error of parts per million order could not be avoided using famous wavelength compensation equations. Chromatic dispersion of the refractive index in air can almost be disregarded when a 1560 nm wavelength produced by a rubidium (Rb) stabilized distributed feedback (DFB) diode laser is used as a reference wavelength. We describe a novel dual-wavelength self-calibration scheme that maintains high accuracy of the wavelength meter. The method uses the fundamental and second-harmonic wavelengths of an Rb-stabilized DFB diode laser. Consequently, a highly accurate Michelson type wavelength meter with an absolute accuracy of 5 × 10 8 ( 10 MHz , 0.08 pm ) over a wide wavelength range including optical communication bands was achieved without the need for a vacuum chamber.

© 2009 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 2, 2009
Revised Manuscript: July 6, 2009
Manuscript Accepted: July 8, 2009
Published: July 21, 2009

Shin Masuda, Eiji Kanoh, Akiyoshi Irisawa, and Shoji Niki, "Highly accurate Michelson type wavelength meter that uses a rubidium stabilized 1560 nm diode laser as a wavelength reference," Appl. Opt. 48, 4285-4290 (2009)

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