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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 22 — Aug. 1, 2009
  • pp: 4430–4436

Measurement method for the refractive index of thick solid and liquid layers

Branko Šantić, Davor Gracin, and Krunoslav Juraić  »View Author Affiliations

Applied Optics, Vol. 48, Issue 22, pp. 4430-4436 (2009)

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A simple method is proposed for the refractive index measurement of thick solid and liquid layers. In contrast to interferometric methods, no mirrors are used, and the experimental setup is undemanding and simple. The method is based on the variation of transmission caused by optical interference within the layer as a function of incidence angle. A new equation is derived for the positions of the interference extrema versus incidence angle. Scattering at the surfaces and within the sample, as well as weak absorption, do not play important roles. The method is illustrated by the refractive index measurements of sapphire, window glass, and water.

© 2009 Optical Society of America

OCIS Codes
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5710) Instrumentation, measurement, and metrology : Refraction

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 6, 2009
Revised Manuscript: July 10, 2009
Manuscript Accepted: July 11, 2009
Published: July 24, 2009

Branko Šantić, Davor Gracin, and Krunoslav Juraić, "Measurement method for the refractive index of thick solid and liquid layers," Appl. Opt. 48, 4430-4436 (2009)

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  1. S. Singh, “Refractive index measurement and its applications,” Phys. Scr. 65, 167-180 (2002). [CrossRef]
  2. M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University, 1999).
  3. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, 1965).
  4. H. A. Macleod, Thin-Film Optical Filters, 3rd ed. (Institute of Physics, 2001). [CrossRef]
  5. S. Y. El-Zaiat, “Measuring the thickness and refractive index of a thick transparent plate by an unexpanded laser beam,” Opt. Laser Technol. 29, 63-65 (1997). [CrossRef]
  6. R. Ulrich and R. Torge, “Measurement of thin film parameters with a prism coupler,” Appl. Opt. 12, 2901-2908 (1973). [CrossRef] [PubMed]
  7. M. Galli, F. Marabelli, and D. Comoretto, “Interferometric determination of the anisotropic refractive index dispersion of poly-(p-phenylene-vinylene),” Appl. Phys. Lett. 86, 201119(2005). [CrossRef]
  8. M. J. Jang and C. F. Lu,“ A measurement system for determining the thickness of an optical wave plate,” Opt. Commun. 253, 2-9 (2005). [CrossRef]
  9. S. Y. El-Zaiat, “Group refractive index measurement by fringes of equal chromatic order,” Opt. Laser Technol. 37, 181-186 (2005). [CrossRef]
  10. H. Moosmüller and W. P. Arnott, “Folded Jamin interferometer: a stable instrument for refractive-index measurements,” Opt. Lett. 21, 438-440 (1996). [CrossRef] [PubMed]
  11. M. Ohmi, T. Shiraishi, H. Tajiri, and M. Haruna, “Simultaneous measurement of refractive index and thickness of transparent plates by low coherence interferometry,” Opt. Rev. 4, 507-515 (1997). [CrossRef]
  12. D. E. Aspnes, “Expanding horizons: new developments in ellipsometry and polarimetry,” Thin Solid Films 455-456, 3-13 (2004). [CrossRef]
  13. M. Schubert, “Generalized ellipsometry and complex optical systems,” Thin Solid Films 313-314, 323-332(1998). [CrossRef]
  14. R. Goldhahn, S. Shokhovets, J. Scheiner, G. Gobsch, T. S. Cheng, C. T. Foxon, U. Kaiser, D. Kipshidze, and W. Richter, “Determination of group III nitride film properties by reflectance and spectroscopic ellipsometry studies,” Phys. Status Solidi A 177, 107-115 (2000). [CrossRef]
  15. T. Fukano and I. Yamaguchi, “Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope,” Appl. Opt. 38, 4065-4073 (1999). [CrossRef]
  16. B. Šantić and F. Scholz, “On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films,” Meas. Sci. Technol. 19, 105303 (2008). [CrossRef]
  17. J. C. Manifacier, J. Gasiot, and J. P. Fillard, “A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film,” J. Phys. E 9, 1002-1004 (1976). [CrossRef]
  18. W. A. Pliskin, “Refractive index dispersion of dielectric films used in the semiconductor industry,” J. Electrochem. Soc. 134, 2819-2826 (1987). [CrossRef]
  19. R. Swanepoel, “Determination of the thickness and optical constants of a-Si,” J. Phys. E 16, 1214-1222(1983). [CrossRef]
  20. W. A. Pliskin and E. E. Conrad, “Nondestructive determination of thickness and refractive index of transparent films,” IBM J. Res. Dev. 8, 43-51 (1964). [CrossRef]
  21. A. J. Warnecke and P. J. LoPresti, “Refractive index dispersion in semiconductor-related thin films,” IBM J. Res. Dev. 17, 256-262 (1973). [CrossRef]
  22. B. Šantić, “Simultaneous measurement of the refractive index and thickness of a thin film,” submitted to Thin Solid Films.
  23. K. Ishikawa, H. Yamano, K. Kagawa, K. Asada, K. Iwata, and M. Ueda, “Measurement of thickness of a thin film by means of laser interference at many incident angles,” Opt. Lasers Eng. 41, 19-29 (2004). [CrossRef]
  24. C. Jung and B. K. Rhee, “Simultaneous determination of thickness and optical constants of polymer thin film by analyzing transmittance,” Appl. Opt. 41, 3861-3865(2002). [CrossRef] [PubMed]
  25. R. Swanepoel, “Determining refractive index and thickness of thin films from wavelength measurements only,” J. Opt. Soc. Am. A 2, 1339-1343 (1985). [CrossRef]
  26. A. Lamminpää, S. Nevas, F. Manoocheri, and E. Ikonen, “Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence,” Appl. Opt. 45, 1392-1396 (2006). [CrossRef] [PubMed]
  27. B. Cox and Y.-M. Wong, “Direct measurement of the thickness and optical properties of zirconia corrosion films,” J. Nucl. Mater. 199, 258-271 (1993). [CrossRef]
  28. G. I. Surdutovich, R. Z. Vitlina, and V. Baranauskas, “Simple reflectometric method for measurement of weakly absorbing films,” Thin Solid Films 355-356, 446-450 (1999). [CrossRef]
  29. H. El-Kashef, G. E. Hassan, and I. El-Ghazaly, “Mach-Zehnder optical system as a sensitive measuring instrument,” Appl. Opt. 33, 3540-3544 (1994). [CrossRef] [PubMed]
  30. M. A. Khashan and A. Y. Nassif, “Accurate measurement of the refractive indices of solids and liquids by the double-layer interferometer,” Appl. Opt. 39, 5991-5997 (2000). [CrossRef]
  31. Properties of sapphire, http://www.mellesgriot.com/products/optics/mp_3_5.htm.

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