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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 23 — Aug. 10, 2009
  • pp: 4568–4576

Full-field and full-range sequential measurement of the slow axis angle and phase retardation of linear birefringent materials

Tsung-Chih Yu, Hsu Shan, Thi Thu Hien Pham, and Yu-Lung Lo  »View Author Affiliations

Applied Optics, Vol. 48, Issue 23, pp. 4568-4576 (2009)

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A method is proposed for obtaining full-range sequential measurements of the slow axis angle and phase retardation of linear birefringent materials (LBMs) using a full-field heterodyne interferometer with a charge-coupled device (CCD) camera and an image processing algorithm based on a three-frame integrating-bucket method. The dynamic ranges of the principal axis and phase retardation measurements extend from 0 ° to 180 ° and from 0 ° to 360 ° , respectively. The proposed method not only enables full-range measurements of the slow axis angle to be obtained, but also allows a decision to be made as to whether the principal axis labeled by the manufacturer is the slow axis or the fast axis. The standard deviations of the slow axis angle and phase retardation measurements are found to be 0.14 ° and 0.27 ° , respectively. In addition, it is shown that the noises induced by environmental disturbances are reduced by elimination of the dc component of the output light intensity in the image processing algorithm. We also investigate the sensitivity of the measured error caused by the orientation of LBM.

© 2009 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 17, 2009
Revised Manuscript: June 23, 2009
Manuscript Accepted: July 12, 2009
Published: August 4, 2009

Tsung-Chih Yu, Hsu Shan, Thi Thu Hien Pham, and Yu-Lung Lo, "Full-field and full-range sequential measurement of the slow axis angle and phase retardation of linear birefringent materials," Appl. Opt. 48, 4568-4576 (2009)

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