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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 26 — Sep. 10, 2009
  • pp: 4880–4884

Analysis of the imaging method for assessment of the smile of laser diode bars

Luis Martí-López, José A. Ramos-de-Campos, and Walter D. Furlan  »View Author Affiliations


Applied Optics, Vol. 48, Issue 26, pp. 4880-4884 (2009)
http://dx.doi.org/10.1364/AO.48.004880


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Abstract

We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 μm for a mean wavelength of λ 800 nm . Our results suggest that, with the current state-of-the-art, the formation of imaging methods for LDB smile assessment can be used to assess smile heights 1 μm .

© 2009 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(140.2010) Lasers and laser optics : Diode laser arrays

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 30, 2008
Revised Manuscript: July 21, 2009
Manuscript Accepted: August 10, 2009
Published: September 1, 2009

Citation
Luis Martí-López, José A. Ramos-de-Campos, and Walter D. Furlan, "Analysis of the imaging method for assessment of the smile of laser diode bars," Appl. Opt. 48, 4880-4884 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-26-4880


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